Ultimate Limits of Fabrication and Measurement
Overview
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Editors:
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M. E. Welland
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Department of Engineering, The University of Cambridge, Cambridge, UK
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J. K. Gimzewski
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IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland
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About this book
An extensive body of research is involved in pushing miniaturisation to its physical limit, encompassing the miniaturisation of electronic devices, the manipulation of single atoms by scanning tunnelling microscopy, bio-engineering, the chemical synthesis of complex molecules, microsensor technology, and information storage and retrieval. In parallel to these practical aspects of miniaturisation there is also the necessity to understand the physics of small structures.
Ultimate Limits of Fabrication and Measurement brings together a number of leading articles from a variety of fields with the common aim of ultimate miniaturisation and measurement.
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Keywords
Table of contents (35 chapters)
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Towards Molecular and Supramolecular Devices
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Nanoscale Fabrication
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Microminiaturization in Laser Surgery and in vivo Intradiscal Pressure Measurement in Intervertebral Discs
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Self Replicating Systems and Low Cost Manufacturing
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The Use of Actuation Principles for Micro Robots
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Biophysical Approach to Nano-Mental Engineering’s Limits
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IDEAS -Intelligent Design Environment for Algorithms and Systems
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Electron-Nucleus Interaction in a Finite Atomic Line Modulated by a Focussed Electric Field
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Electromagnetic Radiation in Nanostructures
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Using Atom Optics to Fabricate Nanostructures
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Limits to Squeezing of Quantum Fluctuations
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Micromechanical Calorimeter with Picojoule-Sensitivity
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The Point-Contact Thermometer and Its Application in the Study of Hydrodynamic Electron Flow
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Noise in Scanning Tunneling Microscopy
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A Nanosensor for Admittance Spectroscopy
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Nanodeformation -Solid or Liquid?
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Theory of Conduction through Quantum Necks
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A Scanning Force and Friction Microscope
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Electrical Properties of Nanometer-Size Metal-Semiconductor Point Contacts
Editors and Affiliations
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Department of Engineering, The University of Cambridge, Cambridge, UK
M. E. Welland
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IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland
J. K. Gimzewski
Bibliographic Information
Book Title: Ultimate Limits of Fabrication and Measurement
Editors: M. E. Welland, J. K. Gimzewski
Series Title: NATO Science Series E:
DOI: https://doi.org/10.1007/978-94-011-0041-0
Publisher: Springer Dordrecht
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media Dordrecht 1995
Hardcover ISBN: 978-0-7923-3504-7Published: 31 May 1995
Softcover ISBN: 978-94-010-4023-5Published: 23 October 2012
eBook ISBN: 978-94-011-0041-0Published: 06 December 2012
Series ISSN: 0168-132X
Edition Number: 1
Number of Pages: X, 254
Topics: Condensed Matter Physics, Organic Chemistry, Electrical Engineering, Biochemistry, general, Surfaces and Interfaces, Thin Films