Magnetic force microscope, the Glossary

Table of Contents

1. 18 relations: Atomic force microscopy, Cantilever, Coercivity, Faraday cage, Gauss (unit), Magnetic dipole–dipole interaction, Magnetic field, Magnetic moment, Monocrystalline silicon, Newton (unit), Nickel, Piezoelectricity, Raster scan, Scanning tunneling microscope, Silicon dioxide, Silicon nitride, Tesla (unit), Vacuum permeability.

2. Scanning probe microscopy

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Magnetic force microscope and Atomic force microscopy are scanning probe microscopy.

See Magnetic force microscope and Atomic force microscopy

Cantilever

A cantilever is a rigid structural element that extends horizontally and is unsupported at one end.

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Coercivity

Coercivity, also called the magnetic coercivity, coercive field or coercive force, is a measure of the ability of a ferromagnetic material to withstand an external magnetic field without becoming demagnetized.

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Faraday cage

A Faraday cage or Faraday shield is an enclosure used to block some electromagnetic fields.

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Gauss (unit)

The gauss (symbol:, sometimes Gs), is a unit of measurement of magnetic induction, also known as magnetic flux density.

See Magnetic force microscope and Gauss (unit)

Magnetic dipole–dipole interaction

Magnetic dipole–dipole interaction, also called dipolar coupling, refers to the direct interaction between two magnetic dipoles.

See Magnetic force microscope and Magnetic dipole–dipole interaction

Magnetic field

A magnetic field (sometimes called B-field) is a physical field that describes the magnetic influence on moving electric charges, electric currents, and magnetic materials.

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Magnetic moment

In electromagnetism, the magnetic moment or magnetic dipole moment is the combination of strength and orientation of a magnet or other object or system that exerts a magnetic field.

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Monocrystalline silicon

Monocrystalline silicon, more often called single-crystal silicon, in short mono c-Si or mono-Si, is the base material for silicon-based discrete components and integrated circuits used in virtually all modern electronic equipment.

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Newton (unit)

The newton (symbol: N) is the unit of force in the International System of Units (SI).

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Nickel

Nickel is a chemical element; it has symbol Ni and atomic number 28.

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Piezoelectricity

Piezoelectricity is the electric charge that accumulates in certain solid materials—such as crystals, certain ceramics, and biological matter such as bone, DNA, and various proteins—in response to applied mechanical stress.

See Magnetic force microscope and Piezoelectricity

Raster scan

A raster scan, or raster scanning, is the rectangular pattern of image capture and reconstruction in television.

See Magnetic force microscope and Raster scan

Scanning tunneling microscope

A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Magnetic force microscope and scanning tunneling microscope are scanning probe microscopy.

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Silicon dioxide

Silicon dioxide, also known as silica, is an oxide of silicon with the chemical formula, commonly found in nature as quartz.

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Silicon nitride

Silicon nitride is a chemical compound of the elements silicon and nitrogen.

See Magnetic force microscope and Silicon nitride

Tesla (unit)

The tesla (symbol: T) is the unit of magnetic flux density (also called magnetic B-field strength) in the International System of Units (SI).

See Magnetic force microscope and Tesla (unit)

Vacuum permeability

The vacuum magnetic permeability (variously vacuum permeability, permeability of free space, permeability of vacuum, magnetic constant) is the magnetic permeability in a classical vacuum.

See Magnetic force microscope and Vacuum permeability

See also

Scanning probe microscopy

• A Boy and His Atom
• Atomic force acoustic microscopy
• Atomic force microscopy
• Ballistic electron emission microscopy
• Bimodal atomic force microscopy
• Campanile probe
• Chemical force microscopy
• Conductive atomic force microscopy
• Counter-scanning
• Dip-pen nanolithography
• Electrochemical AFM
• Electrochemical scanning tunneling microscope
• Electrostatic force microscope
• Feature-oriented positioning
• Force spectroscopy
• IBM (atoms)
• Infrared Nanospectroscopy (AFM-IR)
• Kelvin probe force microscope
• Local oxidation nanolithography
• Magnetic force microscope
• Magnetic resonance force microscopy
• Millipede memory
• Mochii
• Nano-FTIR
• Nanofountain probe
• Near-field scanning optical microscope
• Non-contact atomic force microscopy
• Photoconductive atomic force microscopy
• Photon scanning microscopy
• Photothermal microspectroscopy
• Piezoresponse force microscopy
• Probe tip
• Scanning Hall probe microscope
• Scanning SQUID microscopy
• Scanning capacitance microscopy
• Scanning gate microscopy
• Scanning ion-conductance microscopy
• Scanning joule expansion microscopy
• Scanning probe lithography
• Scanning probe microscopy
• Scanning quantum dot microscopy
• Scanning thermal microscopy
• Scanning tunneling microscope
• Scanning tunneling spectroscopy
• Scanning voltage microscopy
• Spin-polarized scanning tunneling microscopy
• Vibrational analysis with scanning probe microscopy

References

[1] https://en.wikipedia.org/wiki/Magnetic_force_microscope

Also known as Magnetic Force Microscopy.