Nanostructured film, the Glossary
A nanostructured film is a film resulting from engineering of nanoscale features, such as dislocations, grain boundaries, defects, or twinning.[1]
Table of Contents
15 relations: Copper, Crystal twinning, Dislocation, Electron backscatter diffraction, Focused ion beam, Grain boundary, Nanoindentation, Nanomaterials, Nanoparticle, Nanostructure, Scanning electron microscope, Sputter deposition, Sputtering, Strength of materials, Transmission electron microscopy.
Copper
Copper is a chemical element; it has symbol Cu and atomic number 29.
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Crystal twinning
Crystal twinning occurs when two or more adjacent crystals of the same mineral are oriented so that they share some of the same crystal lattice points in a symmetrical manner.
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Dislocation
In materials science, a dislocation or Taylor's dislocation is a linear crystallographic defect or irregularity within a crystal structure that contains an abrupt change in the arrangement of atoms.
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Electron backscatter diffraction
Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials.
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Focused ion beam
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials.
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Grain boundary
In materials science, a grain boundary is the interface between two grains, or crystallites, in a polycrystalline material.
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Nanoindentation
Nanoindentation, also called instrumented indentation testing, is a variety of indentation hardness tests applied to small volumes.
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Nanomaterials
Nanomaterials describe, in principle, chemical substances or materials of which a single unit is sized (in at least one dimension) between 1 and 100 nm (the usual definition of nanoscale).
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Nanoparticle
A nanoparticle or ultrafine particle is a particle of matter 1 to 100 nanometres (nm) in diameter.
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Nanostructure
A nanostructure is a structure of intermediate size between microscopic and molecular structures. Nanostructured film and nanostructure are Nanomaterials.
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Scanning electron microscope
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.
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Sputter deposition
Sputter deposition is a physical vapor deposition (PVD) method of thin film deposition by the phenomenon of sputtering.
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Sputtering
In physics, sputtering is a phenomenon in which microscopic particles of a solid material are ejected from its surface, after the material is itself bombarded by energetic particles of a plasma or gas.
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Strength of materials
The field of strength of materials (also called mechanics of materials) typically refers to various methods of calculating the stresses and strains in structural members, such as beams, columns, and shafts.
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Transmission electron microscopy
Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image.
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