CN102298085A - Loading plate - Google Patents
- ️Wed Dec 28 2011
CN102298085A - Loading plate - Google Patents
Loading plate Download PDFInfo
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Publication number
- CN102298085A CN102298085A CN201010208863XA CN201010208863A CN102298085A CN 102298085 A CN102298085 A CN 102298085A CN 201010208863X A CN201010208863X A CN 201010208863XA CN 201010208863 A CN201010208863 A CN 201010208863A CN 102298085 A CN102298085 A CN 102298085A Authority
- CN
- China Prior art keywords
- pin
- voltage
- test point
- golden finger
- voltage signal Prior art date
- 2010-06-24 Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Structure Of Printed Boards (AREA)
Abstract
The invention relates to a loading plate, which comprises a printed circuit board, a first gold finger and a second gold finger, wherein the first gold finger comprises a first voltage pin, a second voltage pin and a first grounding pin; the second gold finger comprises a third voltage pin, a fourth voltage pin and a second grounding pin; and the loading plate is also provided with a first voltage signal test point, a second voltage signal test point, a first grounding signal test point and a second grounding signal test point, wherein the first and the second voltage signal test points are respectively connected with the first voltage pin and the second voltage pin of the first gold finger, the first and the second grounding signal test points are connected with the first grounding pin of the first gold finger, the first and the second voltage signal test points are respectively connected to the third and the fourth voltage pins of the second gold finger, and the first grounding signal test points are connected to the second grounding pin of the second gold finger. According to the invention, the compatibility of the loading plate is improved; and the invention is convenient and fast.
Description
Technical field
The present invention relates to a kind of load board.
Background technology
At present, the voltage of internal memory is to be provided by VRM (voltage regulate module, Voltage Regulator Module) on the mainboard, and what adopt usually when the voltage that internal memory is obtained measures is special fixture.But this special fixture has the restriction of maximum current and peak power, damage easily as misoperation, and the operation signal generator of the time also must arranging in pairs or groups uses, and is inconvenient quick.
Summary of the invention
In view of above content, be necessary to provide a kind of load board, measure the voltage that obtains on the internal memory quickly and easily.
A kind of load board, comprise a printed circuit board (PCB), be arranged on peg graft second golden finger of one second slot of first golden finger and being used to of one first slot of pegging graft that is used at these printed circuit board (PCB) two ends, this first golden finger comprises first voltage pin of a pair of first voltage signal pin that should first slot, first grounding pin of second voltage pin of a pair of second voltage signal pin that should first slot and a pair of first ground signalling pin that should first slot, this second golden finger comprises the tertiary voltage pin of a pair of tertiary voltage signal pin that should second slot, second grounding pin of the 4th voltage pin of a pair of the 4th voltage signal pin that should second slot and a pair of second ground signalling pin that should second slot, also be provided with one first voltage signal test point on this load board, one second voltage signal test point, the a pair of first ground signalling test point and a pair of second ground signalling test point that should the second voltage signal test point that should the first voltage signal test point, this is first years old, the second voltage signal test point connects first of this first golden finger respectively, second voltage pin, this is first years old, the second ground signalling test point connects first grounding pin of this first golden finger, this is first years old, the second voltage signal test point also connects the 3rd of this second golden finger respectively, the 4th voltage pin, this is first years old, the second ground signalling test point is connected to second grounding pin of this second golden finger.
Load board of the present invention is compared to prior art, this load board comprises first, second golden finger, first, the second voltage signal test point, when this first golden finger is plugged in this first slot, determine to be plugged in first and second voltage that obtains behind this first slot by measuring this first voltage signal test point when this first plugboard, when this second golden finger is plugged in this second slot, determine to be plugged in first and second voltage that obtains behind this second slot by measuring this second voltage signal test point when this second plugboard, thereby it is improved the compatibility of load board, and convenient and swift.
Description of drawings
Below in conjunction with accompanying drawing and better embodiment the present invention is described in further detail:
Fig. 1 is a load board better embodiment synoptic diagram of the present invention.
The main element symbol description
Printed circuit board (PCB) 10
The first voltage
signal test point11
The second voltage
signal test point12
The first ground
signalling test point13
The second ground
signalling test point14
Embodiment
With reference to figure 1, the better embodiment of this
load board100 comprises that a printed circuit board (PCB) 10 and is located at first
golden finger20 and second
golden finger30 of these 10 liang of opposite ends of printed circuit board (PCB).This first
golden finger20 can with a computer motherboard on be used to peg graft corresponding the pegging graft of a DIMM (Dual Inline MemoryModule, dual inline memory module) slot (not shown) of one first internal memory.This second
golden finger30 can with this computer motherboard on be used to peg graft the corresponding grafting of the second dimm socket (not shown) of one second internal memory.This first
golden finger20 comprises one
first voltage pin21, one
second voltage pin22 and one first grounding pin 23.This second
golden finger30 comprises a
tertiary voltage pin31, one the
4th voltage pin32 and one second grounding pin 33.First,
second voltage pin21,22 of this first
golden finger20 and
first grounding pin23 correspond respectively to first, second voltage signal pin and the first ground signalling pin in this first dimm socket.The the 3rd, the
4th voltage pin31,32 of this second
golden finger30 and
second grounding pin33 correspond respectively to the 3rd, the 4th voltage signal pin and the second ground signalling pin in this second dimm socket.
Also be provided with the first voltage
signal test point11, the second voltage
signal test point12, a pair of first ground
signalling test point13 and a pair of second ground
signalling test point14 that should the second voltage
signal test point12 that should the first voltage
signal test point11 on this printed circuit board (PCB) 10.This first voltage
signal test point11 is connected to
first voltage pin21 of this first
golden finger20 and the
tertiary voltage pin31 of this second golden finger 30.This second voltage
signal test point12 is connected to
second voltage pin22 of this first
golden finger20 and the
4th voltage pin32 of this second golden finger 30.This first ground
signalling test point13 is connected to
first grounding pin23 of this first
golden finger20 and
second grounding pin33 of this second
golden finger30 respectively.This second ground
signalling test point14 is connected to
first grounding pin23 of this first
golden finger20 and
second grounding pin33 of this second
golden finger30 respectively.
When need are tested first internal memory and are plugged in this first dimm socket during available first and second voltage, first
golden finger20 of this
load board100 is inserted in these first dimm sockets, and this first, second voltage
signal test point11,12 first and
second voltage pin21,22 by this first
golden finger20 respectively is connected to first and second voltage signal pin on this first dimm socket.This first, second ground
signalling test point13,14
first grounding pin23 by this first
golden finger20 respectively is connected to the first ground signalling pin on this first dimm socket.And this first, second voltage
signal test point11,12 and first, second ground
signalling test point13,14 are connected to the corresponding test lead of a signal tester respectively, thereby can obtain first and second voltage on this
load board100, so can determine first and second voltage of obtaining when deserving this first internal memory is plugged in this first dimm socket.
When need are tested second internal memory and are plugged in this second dimm socket during the available the 3rd and the 4th voltage, second
golden finger30 of this
load board100 is inserted in these second dimm sockets, and this first, second voltage
signal test point11,12 the 3rd and the
4th voltage pin31,32 by this second
golden finger30 respectively is connected to the 3rd and the 4th voltage signal pin on this second dimm socket.This first, second ground
signalling test point13,14
second grounding pin33 by this second
golden finger30 respectively is connected to the second ground signalling pin on this second dimm socket.And this first, second voltage
signal test point11,12 and first, second ground
signalling test point13,14 are connected to the corresponding test lead of a signal tester respectively, thereby can obtain the 3rd and the 4th voltage on this
load board100, so can determine the 3rd and the 4th voltage that obtains when deserving this second internal memory is plugged in this second dimm socket.
In the present embodiment, these first golden finger, 20 corresponding DDR2 internal memories.These second golden finger, 30 corresponding DDR3 internal memories.In other true mode, this
load board100 also can substitute other chip and test the voltage that obtains after other chip inserted is gone in the corresponding slot.
100 of the present invention comprises first and second
golden finger20,30, thereby measure the voltage that obtains on the
load board100 in corresponding first and second dimm socket of can pegging graft as required, thereby can utilize this
load board100 to obtain voltage on DDR2 and the DDR3 internal memory, improved the compatibility of load board, and convenient and swift.
Claims (3)
1. load board, comprise a printed circuit board (PCB), be arranged on peg graft second golden finger of one second slot of first golden finger and being used to of one first slot of pegging graft that is used at these printed circuit board (PCB) two ends, this first golden finger comprises first voltage pin of a pair of first voltage signal pin that should first slot, first grounding pin of second voltage pin of a pair of second voltage signal pin that should first slot and a pair of first ground signalling pin that should first slot, this second golden finger comprises the tertiary voltage pin of a pair of tertiary voltage signal pin that should second slot, second grounding pin of the 4th voltage pin of a pair of the 4th voltage signal pin that should second slot and a pair of second ground signalling pin that should second slot, also be provided with one first voltage signal test point on this load board, one second voltage signal test point, the a pair of first ground signalling test point and a pair of second ground signalling test point that should the second voltage signal test point that should the first voltage signal test point, this is first years old, the second voltage signal test point connects first of this first golden finger respectively, second voltage pin, this is first years old, the second ground signalling test point connects first grounding pin of this first golden finger, this is first years old, the second voltage signal test point also connects the 3rd of this second golden finger respectively, the 4th voltage pin, this is first years old, the second ground signalling test point is connected to second grounding pin of this second golden finger.
2. load board as claimed in claim 1 is characterized in that: the corresponding DDR2 internal memory of described first golden finger, the corresponding DDR3 internal memory of described second golden finger.
3. load board as claimed in claim 1 is characterized in that: described first and second golden finger is arranged on the relative two ends of described printed circuit board (PCB).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201010208863XA CN102298085A (en) | 2010-06-24 | 2010-06-24 | Loading plate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201010208863XA CN102298085A (en) | 2010-06-24 | 2010-06-24 | Loading plate |
Publications (1)
Publication Number | Publication Date |
---|---|
CN102298085A true CN102298085A (en) | 2011-12-28 |
Family
ID=45358640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201010208863XA Pending CN102298085A (en) | 2010-06-24 | 2010-06-24 | Loading plate |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN102298085A (en) |
Cited By (2)
* Cited by examiner, † Cited by third partyPublication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103901249A (en) * | 2012-12-28 | 2014-07-02 | 鸿富锦精密工业(武汉)有限公司 | Interface signal test device |
CN104280572A (en) * | 2013-07-12 | 2015-01-14 | 上海华虹宏力半导体制造有限公司 | ATE test channel designing method |
Citations (6)
* Cited by examiner, † Cited by third partyPublication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5436570A (en) * | 1991-05-21 | 1995-07-25 | Tan; Yin L. | Burn-in test probe for fine-pitch packages with side contacts |
US6357022B1 (en) * | 1998-04-08 | 2002-03-12 | Kingston Technology Co. | Testing memory modules on a solder-side adaptor board attached to a PC motherboard |
US20050277337A1 (en) * | 2004-05-12 | 2005-12-15 | Asrock Incorporation | Computer system with PCI express interface |
CN101206603A (en) * | 2006-12-22 | 2008-06-25 | 鸿富锦精密工业(深圳)有限公司 | AD signal interface card based on PCI |
CN201251780Y (en) * | 2008-07-18 | 2009-06-03 | 英业达科技有限公司 | Internal memory test tool |
US20090248943A1 (en) * | 2008-04-01 | 2009-10-01 | Inventec Corporation | Server |
-
2010
- 2010-06-24 CN CN201010208863XA patent/CN102298085A/en active Pending
Patent Citations (6)
* Cited by examiner, † Cited by third partyPublication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5436570A (en) * | 1991-05-21 | 1995-07-25 | Tan; Yin L. | Burn-in test probe for fine-pitch packages with side contacts |
US6357022B1 (en) * | 1998-04-08 | 2002-03-12 | Kingston Technology Co. | Testing memory modules on a solder-side adaptor board attached to a PC motherboard |
US20050277337A1 (en) * | 2004-05-12 | 2005-12-15 | Asrock Incorporation | Computer system with PCI express interface |
CN101206603A (en) * | 2006-12-22 | 2008-06-25 | 鸿富锦精密工业(深圳)有限公司 | AD signal interface card based on PCI |
US20090248943A1 (en) * | 2008-04-01 | 2009-10-01 | Inventec Corporation | Server |
CN201251780Y (en) * | 2008-07-18 | 2009-06-03 | 英业达科技有限公司 | Internal memory test tool |
Cited By (2)
* Cited by examiner, † Cited by third partyPublication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103901249A (en) * | 2012-12-28 | 2014-07-02 | 鸿富锦精密工业(武汉)有限公司 | Interface signal test device |
CN104280572A (en) * | 2013-07-12 | 2015-01-14 | 上海华虹宏力半导体制造有限公司 | ATE test channel designing method |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
2011-12-28 | C06 | Publication | |
2011-12-28 | PB01 | Publication | |
2013-07-17 | C10 | Entry into substantive examination | |
2013-07-17 | SE01 | Entry into force of request for substantive examination | |
2015-09-09 | C05 | Deemed withdrawal (patent law before 1993) | |
2015-09-09 | WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20111228 |