CN109192114A - DVI signal testing method - Google Patents
- ️Fri Jan 11 2019
CN109192114A - DVI signal testing method - Google Patents
DVI signal testing method Download PDFInfo
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Publication number
- CN109192114A CN109192114A CN201810957782.6A CN201810957782A CN109192114A CN 109192114 A CN109192114 A CN 109192114A CN 201810957782 A CN201810957782 A CN 201810957782A CN 109192114 A CN109192114 A CN 109192114A Authority
- CN
- China Prior art keywords
- dvi
- transfer board
- testing method
- signal
- signals transfer Prior art date
- 2018-08-22 Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 33
- 238000000034 method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a kind of DVI signal testing methods, which includes: step 1, and the DVI signal of computer is accessed DVI Signals Transfer Board by DVI line；Step 2, it is loaded on tested product by DVI Signals Transfer Board, completes the DVI signal testing of tested product.The DVI signal testing method is used to solve the problems, such as that the reliability of product after DVI signal testing not to be high.
Description
Technical field
The present invention relates to DVI signal testing methods.
Background technique
Special type display field is more and more at present uses DVI signaling interface, shows that product carries out DVI and connects for the type When mouth test, it is required to using DVI line be welded in all kinds of toolings by its pin according to corresponding definition as main material, There is serious integrity problem in this method, display occurs leading to its decoding because of DVI wire insertion often during the test There is no signal failure in wafer damage, product, have seriously affected the display reliability of product, and the product tested uses in the later period There is certain reliability hidden danger in the process.
Summary of the invention
The object of the present invention is to provide a kind of DVI signal testing method, the DVI signal testing method is for solving DVI letter The not high problem of reliability of product after number test.
To achieve the goals above, the present invention provides a kind of DVI signal testing method, the DVI signal testing method packets It includes:
Step 1, the DVI signal of computer is accessed into DVI Signals Transfer Board by DVI line；
Step 2, it is loaded on tested product by DVI Signals Transfer Board, the DVI signal for completing tested product is surveyed Examination.
Preferably, in step 2, toggle switch is set in the signal path of DVI Signals Transfer Board, and tested in test When trial product, the toggle switch is opened.
Preferably, the DVI signal testing method further include:
It is required to disconnect DVI signal using toggle switch before DVI line and DVI Signals Transfer Board are connected and disconnected from, then Carry out DVI line and DIV Signals Transfer Board again connects or disconnects operation.
Preferably, 8 tunnels are set by the toggle switch in the signal path of DVI Signals Transfer Board.
Preferably, the DVI base that can be loaded on tested product, the DVI are provided on DVI Signals Transfer Board Base can directly be connect by standard DVI line with computer.
Preferably, in step 2, the timing of DVI signal realizes the DVI letter of different resolution by the EDID decoding of connection Number load.
According to the above technical scheme, circuit of the present invention is simple, and the reliability of product is not high after solution DVI signal testing asks Topic；It is versatile, it is at low cost, it is easy to use.So that there is no reliabilities in later period use process is hidden for the product after test Suffer from.
Other features and advantages of the present invention will the following detailed description will be given in the detailed implementation section.
Detailed description of the invention
The drawings are intended to provide a further understanding of the invention, and constitutes part of specification, with following tool Body embodiment is used to explain the present invention together, but is not construed as limiting the invention.In the accompanying drawings:
Fig. 1 is the structural schematic diagram for illustrating a kind of DVI Signals Transfer Board of the invention.
Specific embodiment
Below in conjunction with attached drawing, detailed description of the preferred embodiments.It should be understood that this place is retouched The specific embodiment stated is merely to illustrate and explain the present invention, and is not intended to restrict the invention.
The present invention provides a kind of DVI signal testing method, which includes:
Step 1, the DVI signal of computer is accessed into DVI Signals Transfer Board by DVI line；
Step 2, it is loaded on tested product by DVI Signals Transfer Board, the DVI signal for completing tested product is surveyed Examination.
According to the above technical scheme, circuit of the present invention is simple, and the reliability of product is not high after solution DVI signal testing asks Topic；It is versatile, it is at low cost, it is easy to use.So that there is no reliabilities in later period use process is hidden for the product after test Suffer from.
In a kind of specific embodiment of the invention, in step 2, set in the signal path of DVI Signals Transfer Board Toggle switch is set, and when testing tested product, opens the toggle switch.
In this embodiment, which can also include:
It is required to disconnect DVI signal using toggle switch before DVI line and DVI Signals Transfer Board are connected and disconnected from, then Carry out DVI line and DIV Signals Transfer Board again connects or disconnects operation.
In this embodiment, 8 tunnels are set by the toggle switch in the signal path of DVI Signals Transfer Board.
In this embodiment, it is female that the DVI that can be loaded on tested product is provided on DVI Signals Transfer Board Seat, the DVI base can directly be connect by standard DVI line with computer.
In this embodiment, in step 2, the timing of DVI signal realizes different points by the EDID decoding of connection The DVI signal loading of resolution.
The DVI signal of computer is accessed DVI Signals Transfer Board by DVI line by the present invention, then passes through DVI Signals Transfer Board It is loaded on tested product, toggle switch is set on DVI Signals Transfer Board, for controlling the on-off of product Yu DVI signal. It is required to disconnect DVI signal using thin code switch before DVI line and DVI Signals Transfer Board are connected and disconnected from, then carries out DVI again Line connects or disconnects operation with DIV Signals Transfer Board.
As shown in Figure 1, totally 8 lines are by dialling by D0, D1, D2 tri- of DVI standard signal to signal wire and CLK clock line Code switch controls on-off, and the timing of signal realizes the DVI signal loading of different resolution by the EDID decoding of connection, can be right EDID programming general program realizes product display resolution as computer-controlled resolution ratio.
The DVI Signals Transfer Board has DVI base, can directly be connect by standard DVI line with computer, realize signal loading It is tested to product.
Signal path devises eight road toggle switch, has cut off the interference of the factors such as electrostatic in swapping process, has avoided production Product are impaired.Improve the reliability of bulk article test DVI signal.
It is described the prefered embodiments of the present invention in detail above in conjunction with attached drawing, still, the present invention is not limited to above-mentioned realities The detail in mode is applied, within the scope of the technical concept of the present invention, a variety of letters can be carried out to technical solution of the present invention Monotropic type, these simple variants all belong to the scope of protection of the present invention.
It is further to note that specific technical features described in the above specific embodiments, in not lance In the case where shield, can be combined in any appropriate way, in order to avoid unnecessary repetition, the present invention to it is various can No further explanation will be given for the combination of energy.
In addition, various embodiments of the present invention can be combined randomly, as long as it is without prejudice to originally The thought of invention, it should also be regarded as the disclosure of the present invention.
Claims (6)
1. a kind of DVI signal testing method, which is characterized in that the DVI signal testing method includes:
Step 1, the DVI signal of computer is accessed into DVI Signals Transfer Board by DVI line；
Step 2, it is loaded on tested product by DVI Signals Transfer Board, completes the DVI signal testing of tested product.
2. DVI signal testing method according to claim 1, which is characterized in that in step 2, in DVI Signals Transfer Board Signal path on toggle switch is set, and when testing tested product, open the toggle switch.
3. DVI signal testing method according to claim 2, which is characterized in that the DVI signal testing method further include:
Be required to disconnect DVI signal using toggle switch before DVI line and DVI Signals Transfer Board are connected and disconnected from, then again into Row DVI line connects or disconnects operation with DIV Signals Transfer Board.
4. DVI signal testing method according to claim 2, which is characterized in that by the signal path of DVI Signals Transfer Board On toggle switch be set as 8 tunnels.
5. DVI signal testing method according to claim 2, which is characterized in that be provided with energy on DVI Signals Transfer Board The DVI base being enough loaded on tested product, the DVI base can directly be connect by standard DVI line with computer.
6. DVI signal testing method according to claim 3, which is characterized in that in step 2, the timing of DVI signal is logical The DVI signal loading of different resolution is realized in the EDID decoding for crossing connection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810957782.6A CN109192114A (en) | 2018-08-22 | 2018-08-22 | DVI signal testing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810957782.6A CN109192114A (en) | 2018-08-22 | 2018-08-22 | DVI signal testing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109192114A true CN109192114A (en) | 2019-01-11 |
Family
ID=64918885
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810957782.6A Pending CN109192114A (en) | 2018-08-22 | 2018-08-22 | DVI signal testing method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109192114A (en) |
Citations (4)
* Cited by examiner, † Cited by third party| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102213974A (en) * | 2010-04-12 | 2011-10-12 | 鸿富锦精密工业（深圳）有限公司 | Computer motherboard |
| CN104219519A (en) * | 2014-09-16 | 2014-12-17 | 硅谷数模半导体（北京）有限公司 | Testing adapter plate, system and method of audio and video interface |
| CN104539940A (en) * | 2014-12-26 | 2015-04-22 | 技嘉科技股份有限公司 | Display signal test fixture and test method |
| CN104795011A (en) * | 2015-04-23 | 2015-07-22 | 福州大学 | EDID (extended display identification data)-integrated display frame deviation detecting system and using method |
-
2018
- 2018-08-22 CN CN201810957782.6A patent/CN109192114A/en active Pending
Patent Citations (4)
* Cited by examiner, † Cited by third party| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102213974A (en) * | 2010-04-12 | 2011-10-12 | 鸿富锦精密工业（深圳）有限公司 | Computer motherboard |
| CN104219519A (en) * | 2014-09-16 | 2014-12-17 | 硅谷数模半导体（北京）有限公司 | Testing adapter plate, system and method of audio and video interface |
| CN104539940A (en) * | 2014-12-26 | 2015-04-22 | 技嘉科技股份有限公司 | Display signal test fixture and test method |
| CN104795011A (en) * | 2015-04-23 | 2015-07-22 | 福州大学 | EDID (extended display identification data)-integrated display frame deviation detecting system and using method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 2019-01-11 | PB01 | Publication | |
| 2019-01-11 | PB01 | Publication | |
| 2019-02-12 | SE01 | Entry into force of request for substantive examination | |
| 2019-02-12 | SE01 | Entry into force of request for substantive examination | |
| 2022-12-30 | RJ01 | Rejection of invention patent application after publication | |
| 2022-12-30 | RJ01 | Rejection of invention patent application after publication |
Application publication date: 20190111 |