CN111934530B - Multi-power supply management system of integrated circuit tester - Google Patents

The embodiment provides a multi-power management system of an integrated circuit testing machine, which is used for controlling a plurality of power supplies. FIG. 1 is a circuit block diagram of a multiple power management system of an integrated circuit tester according to a preferred embodiment of the present application. As shown in fig. 1, a multiple power management system for an integrated circuit tester includes: the power supply control system comprises a

100, a power-off time

200, a power-on time

400 and a

500, wherein the

100 is respectively connected with the power-off time

200, the power-on time

400 and the

500 and is used for controlling the power-off time

200 to generate a signal for powering off the

300, controlling the power-on time

400 to generate a signal for powering on the

300 and controlling the

500 to measure the output voltage of the

300.

FIG. 2 is a block diagram of a topology of a multiple power management system of an integrated circuit tester according to a preferred embodiment of the present application. As shown in fig. 2, the multiple power management system of the integrated circuit tester includes: a

100 and a power-down

200; wherein,

the

100 is connected to the power-down

200, and is configured to generate a power-down signal (the power-down signal is an enable signal TRIG that enables the power-down

200 when the multi-power management system of the integrated circuit tester detects that the

300 is abnormally powered down or the power-down signal is generated).

The power-off

200 comprises a plurality of power-off units 21, the plurality of power-off units 21 are connected in a cascade manner, and the input end of the power-off unit 21 at the first stage in the plurality of power-off units 21 is connected with the

100; the output end of each power-down unit 21 in the plurality of power-down units 21 is respectively connected with at least one power supply in the plurality of

300; the power-down unit 21 is configured to control the

300 connected thereto to be powered down upon receiving a power-down signal (TRIG), and to transmit a signal for powering down to the power-down unit 21 of the next stage (refer to DIS4, DIS3, DIS2 of fig. 2).

When the multi-POWER management system of the integrated circuit tester operates, the POWER down unit 21 of the first stage can be driven by the voltage (see POWER _ OK in fig. 2) provided by the POWER supply of the POWER down

200 and the POWER down signal (TRIG) provided by the

100, output the POWER down signal to control the

300 connected thereto to POWER down, and send a signal for POWER down to the POWER down unit 21 of the next stage (see DIS4 in fig. 2).

The lower power unit 21 of the next stage can be driven by a lower power signal (see DIS4 or DIS3 in fig. 2) output by the lower power unit 21 of the previous stage (which may be the lower power unit 21 of the first stage, or the lower power unit 21 of the next stage connected before and adjacent to the lower power unit 21 of the next stage) and a lower power signal (TRIG) provided by the

100, and output the lower power signal (see EN3 or EN2 in fig. 2) and lower the

300.

The power-down unit 21 of the last stage among the plurality of power-down units 21 can be driven by a power-down signal (refer to DIS3 or DIS2 in fig. 2) output from the power-down unit 21 of the previous stage (may be the power-down unit 21 of the first stage, or may be the power-down unit 21 of the next stage that is connected before and adjacent to the power-down unit 21 of the last stage) and a power-down signal (TRIG) provided by the

100, and output the power-down signal (refer to EN1 in fig. 2) and power down the

300.

In the power-down sequence control, the power-down unit 21 of the previous stage sends a signal for powering down the

300, and the power-down signal is transmitted to the power-down unit 21 of the next stage, so that the power-down of the plurality of

300 is sequentially completed.

In some of these embodiments, the powering down unit 21 comprises: a first input terminal (corresponding to the EN terminal), a second input terminal (corresponding to the VIN terminal), a first output terminal (corresponding to the OUT terminal), and a second output terminal (see DIS4, DIS3, DIS2, DIS1 in fig. 2); the first input end is connected with the control module 100 (the first input end is connected with the power-off enabling

101 of the

100 and receives the control module 100); the first output terminal is connected to at least one

300 of the plurality of

300; the second output end is connected with the second input end of the next-stage power-down unit 21; the second input terminal of the first POWER-down unit 21 is connected to the POWER supply of the POWER-down timing control module 200 (the network label POWER _ OK is used in fig. 2, and the POWER supply maintains a high level for the second input terminal of the first POWER-down unit 21), and the voltage of the POWER supply is within a first set voltage range; wherein, the power-down unit 21 is configured to control the

300 connected to the first output terminal to power down when the voltage at the second input terminal is within a first set voltage range and the first input terminal receives a power-down signal (TRIG), and output the voltage within the first set voltage range to the second input terminal of the power-down unit 21 of the next stage through the second output terminal (refer to DIS4, DIS3, DIS2, and DIS1 in fig. 2).

It should be noted that, in this embodiment, the power supply of the power-down

200 is a +3.3V power supply, and the high level provided by the second input terminal of the power-down unit 21 of the power-down power supply of the first stage is divided by the voltage dividing circuit, and then the voltage of the power supply is reduced to the first set voltage range (greater than 0.6V).

It should be noted that, in this embodiment, the

300 controlled to be powered down by the power down

200 includes a first power supply P1V0 of 1.0V, a second power supply P1V2 of 1.2V, a third power supply P1V8 of 1.8V, a fourth power supply P2V5 of 2.5V, a fifth power supply P5V of 5.0V, a sixth power supply P5V _ a of 5.0V, a seventh power supply-12V of-12V, and an eighth power supply VREF, in a specific embodiment, the power down

200 includes at least a first power down unit 21, a second power down unit, a third power down unit, and a last power down unit 21, which are sequentially arranged in a power down sequence, wherein the first power down unit 21 can output a power down signal (EN 4) for powering down the third power supply P1V8 and the fourth power supply P2V 5; the second power down unit can output a signal (EN 3) that powers down the first power supply P1V 0; the third power down unit can output a signal (EN 2) to power down the fifth power source P5V, the sixth power source P5V _ a, and the seventh power source-12V; the power-down unit 21 of the final stage can output a signal (EN 1) for powering down the second power source P1V2 and the eighth power source VREF.

In some of these embodiments, the power-down unit 21 comprises a lower electronic unit 211 and a voltage control subunit 212, wherein the lower electronic unit 211 comprises said first input terminal, said second input terminal and said first output terminal; said first output terminal of the lower electronic unit 211 is connected to the voltage control subunit 212, the voltage control subunit 212 comprising said second output terminal; the lower electronic unit 211 is configured to control the

300 connected to the first output terminal to be powered down and send signals (corresponding to EN4, EN3, EN2, and EN1) for controlling the

300 connected to the first output terminal to be powered down to the voltage control subunit 212 when the voltage at the second input terminal is within a first set voltage range (vin is greater than 0.6V) and the first input terminal receives a power-down signal (TRIG); and a voltage control subunit 212, configured to, upon receiving a signal for controlling the power-down of the

300 connected to the first output terminal, output a voltage within a first set voltage range to the second input terminal of the power-down unit 21 of the next stage via the second output terminal.

The logic table of the first timing chip in this embodiment is as follows:

Wherein, V_FALLSupply voltage, V, for operation of the first time-sequence chip_FALL= 0.6V. When the first output terminal outputs a low level, the

300 is powered down.

It should be noted that, in the power-down sequence control process, after the power-down unit 21 of the previous stage completes the power-down of the

300, the power-down signal is transmitted to the power-down unit 21 of the next stage, and thus, the power-down of the plurality of

300 is completed in sequence.

It should be further noted that, in the power-down sequence control process, the power-down sequence is performed in a reverse power-up sequence, that is, when the voltage of a

300 does not reach a target value, the power is required to be powered down, and at this time, the power is powered down in a last power-down sequence, that is, the

300 connected to the lower electronic unit 211 of the first-stage power-down unit 21 in the embodiment of the present application is powered down sequentially until the

300 is reached, so as to protect the chip in the multi-power-source management system of the integrated circuit tester from being damaged.

It can be understood that, in order to realize that after the previous power down unit 21 finishes powering down the

300, the power down signal of the

300 can be transmitted to the next power down unit 21, in some embodiments, the voltage control subunit 212 includes a switching tube and a resistor, the switching tube includes a control end, an input end and an output end, wherein the control end of the switching tube is connected to the first output end, the input end of the switching tube is connected in series with the resistor and then connected to the +3.3V of the power supply of the power down

200, and the input end of the switching tube serves as the second output end; the output end of the switching tube is grounded; the switch tube is configured to turn on the input terminal and the output terminal of the switch tube when a control terminal of the switch tube receives a signal (refer to EN4, EN3, EN2, and EN1 in fig. 2) for controlling the power-down of the

300 connected to the first output terminal, so that the second output terminal outputs a voltage within a first set voltage range (corresponding to DIS1 to DIS4 in fig. 2).

In an embodiment, when the first output terminal of the lower electronic unit 211 outputs a low level (EN 4, EN3, EN2, EN1), and the

300 is powered down, at this time, the input terminal of the switching tube is a low level, the switching tube is turned off, the voltage of the second input terminal of the lower electronic unit 211 of the lower electronic unit 21 of the next stage is a high level, and when the

100 outputs a lower electrical signal TRIG (low level), the lower electronic unit 211 of the lower electronic unit 21 of the next stage operates and outputs a low level along the first output terminal to power down the

300 connected thereto.

In some of these embodiments, the multiple power management system of the integrated circuit testing machine further comprises: a

500; the

500 is connected to the plurality of

300 and the

100, and is configured to measure an output voltage of each

300 in the plurality of

300; the

100 is configured to generate a down signal (TRIG) if an output voltage of at least one

300 of the plurality of

300 is not within a second set voltage (corresponding to a voltage provided for each power supply 300).

In this embodiment, the

500 is configured to measure the output voltages of the plurality of

300, and when it is measured that the output voltage of at least one

300 is not within the second setting range, the

100 generates the power-down signal TRIG, and sequentially powers down the power supplies according to a preset timing sequence that the

300 powered up earliest is powered down first.

Fig. 3 is another topology structure diagram of a multiple power management system of an integrated circuit tester according to a preferred embodiment of the present application, and as shown in fig. 3, the multiple power management system of the integrated circuit tester further includes a power-on

400, where the power-on

400 includes a plurality of power-on units 41, the plurality of power-on units 41 are connected in cascade, and an input end of a first power-on unit 41 of the plurality of power-on units 41 is connected to the

100; the output end of each power-on unit 41 in the plurality of power-on units 41 is respectively connected with at least one power supply in the plurality of

300; the power-on unit 41 is configured to control the

300 connected thereto to be powered on when receiving a power-on signal (corresponding to E1/E2/E3/E4 in fig. 3), and send a signal for power-on (corresponding to E2/E3/E4 in fig. 3) to the power-on unit 41 at the next stage.

In some of the possible embodiments, the power-on unit 41 includes: a third input, a fourth input, and a third output; a third input end of the first-stage power-on unit 41 of the plurality of power-on units 41 is connected to the control module 100 (corresponding to the SYS _ PON shown in fig. 3); the third output terminal is connected to at least one

300 of the plurality of power supplies; the third output end is also connected with the third input end of the next-stage power-on unit 41; the fourth input terminal is configured to receive a signal indicating whether the output voltage of the

300 connected to the third output terminal is within a second set voltage range; and a power-up unit 41, configured to control the

300 connected to the third output terminal to power up and output a power-up signal to the third input terminal of the next power-up unit 41 through the third output terminal when the output voltage of the

300 connected to the third output terminal is within the second set voltage range and the third input terminal receives the power-up signal (corresponding to E1/E2/E3/E4 in fig. 3).

It should be noted that, only after the

300 connected to all the upper electronic units 411 of the upper-stage power-on unit 41 completes power-on, all the upper electronic units 411 of the lower-stage power-on unit 41 can be enabled, so as to power on the connected

300.

It should be further noted that, in the embodiment of the present application, the signal received by the fourth input terminal of the power-on unit 41 and indicating whether the output voltage of the

300 connected to the third output terminal is within the second set voltage range may be a signal output by the

100, where the signal output by the

100 is output when all the power supplies 300 of the multiple power supply management system of the integrated circuit testing machine are subjected to the output voltage measurement of the

300 by one

500; the signal may also be a signal directly measured by the

500, and the voltage value of the signal acquired by the

500 is smaller than the voltage value output by the

300 and directly measured by the

500.

In some of these embodiments, the multiple power management system of an integrated circuit testing machine includes a

100, a power-on

400, and a

500; wherein, the third input end of the power-on unit 41 of the power-on timing

400 is connected with the

100; the

500 is connected with the plurality of

300 and the

100; wherein the

500 is configured to measure an output voltage of each

300 of the plurality of

300; the

100 is configured to send a signal indicating that the output voltage of the

300 connected to the third output terminal is within the second set voltage range to the fourth input terminal of the power-on unit 41 when the output voltage of the

300 connected to the third output terminal of the power-on unit 41 is within the second set voltage range.

In this embodiment, the

500 is configured to measure the output voltages of the plurality of

300, and when the measured output voltages of the plurality of

300 are within the second setting range, the

100 generates power-on signals (corresponding to E1 to E4 in fig. 3) to sequentially power up the plurality of

300, and during the power-on process of the

300, the

300 connected to the power-on unit 41 of the next stage can start to be powered up only when all the

300 connected to the power-on unit 41 of the previous stage are powered up (the

500 measures the voltage output by the

300 to be within the second setting range).

In some embodiments, the multiple power management system of the integrated circuit testing machine comprises a

100, a power-on

400, and a plurality of

500, wherein each

500 is used for measuring the output voltage of each

300 in the plurality of

300; the fourth input terminal of the power-on unit 41 of the power-on

400 is connected to the

500 for measuring the voltage of the

300 to which the third output terminal of the power-on unit 41 is connected.

In the present embodiment, each

300 is measured by the independent

500, the signal value measured by the

500 is directly input to the fourth input terminal of the power-on unit 41, when the output voltage of the

300 measured by the

500 is within the second setting range, the power-on unit 41 corresponding to the

300 keeps outputting the power-on signal (corresponding to E1/E2/E3/E4 in fig. 3), so that the

300 keeps being powered on, and the power-on signal for powering on the

300 connected to the power-on unit 41 of the next stage is output to the power-on unit 41 of the next stage.

The logic table of the third sequential chip in this embodiment is as follows:

Wherein, V_SINGSupply voltage, V, for operation of the third sequential chip_SING= 0.6V. When the output terminal outputs a high level, the

300 is powered on.

It should be noted that only after all the upper electronic units 411 of the upper-stage power-up unit 41 are powered up, all the upper electronic units 411 of the upper-stage power-up unit 41 send out a signal for powering up the

300 connected to the lower-stage power-up electronic unit 411, and at the same time, the upper electronic units 411 of the lower-stage power-up unit 41 start to be activated, and when the input end of the corresponding upper electronic unit 411 inputs a matching voltage value, the upper electronic unit 411 outputs the corresponding power-up signal and keeps the connected

300 powered up.

In this embodiment, the

300 with the earlier power-on sequence is later when powered off; meanwhile, in a specific embodiment, the power up and power down timings of

300 are set according to the requirements of a multi-power management system of a specific integrated circuit tester, for example: in the present embodiment, the power supplies 300 controlled to be powered on by the second power-on unit (controlled by the power-on signal E2) are the fifth power supply P5V, the sixth power supply P5V _ a, and the seventh power supply-12V, while in other embodiments, the power supplies 300 controlled to be powered on by the second power-on unit may be

300, and different power-on and power-off timings are set according to different product requirements, and different power-on electronic units included in the power-on unit 41 are set correspondingly, and

300 are set to be powered off by the power-off unit. Of course, in light of the disclosure of the present application, it will be apparent to those skilled in the art that the power-on

400 can be modified by replacing the power-on electronic unit of the power-on unit of one stage with the power-on electronic unit of another stage according to the requirements of the multi-power management system of different integrated circuit testers, and in this application, the power-on electronic unit of each stage 41 and the

300 for controlling power-on are not limited, but the power-on timing control of the power-on electronic unit of the next stage after all the power-on electronic units of the previous stage control the

300 in this application is within the scope of the description and protection of this application.

Fig. 4 is a topological structure diagram of a voltage measurement module, a control module and a plurality of power supplies according to a preferred embodiment of the present application, and as shown in fig. 4, the

500 includes: a plurality of

51, selecting units 52, and measuring

53; wherein, the plurality of

51 are connected with the selecting unit 52, and the selecting unit 52 is connected with the measuring

53; each

51 of the plurality of

51 is connected with one power supply of the plurality of

300; a selection unit 52 for selecting one

300 from the plurality of

300 for measurement by the

53; the

53 is connected to the

100.

When only one

500 exists in the multi-power management system of the integrated circuit test machine, a

300 is selected by the selection unit 52 to be measured.

In the present embodiment, each

51 includes a third resistor (corresponding to reference numerals R19 to R26 in the drawing), a fourth resistor (corresponding to reference numerals R27 to R34 in the drawing), and a first capacitor (corresponding to reference numerals C1 to C8 in the drawing), the third resistor and the fourth resistor are connected in series, an electrical connection point of the third resistor and the fourth resistor is connected to the ground GND through the first capacitor, the other end of the third resistor is electrically connected to the power supply 300 (a voltage measurement point of the power supply 300), and the other end of the fourth resistor is connected to the ground GND.

In some of these alternative embodiments, the selection unit 52 includes, but is not limited to, a multiplexer; in the present embodiment, the

53 includes, but is not limited to, an operational amplifier.

In some embodiments, the

500 further includes a

54, the

54 is configured to clamp and protect the voltage of the

300 delivered to the

53 by the selection unit 52, wherein the

54 includes a first diode D1 and a second diode D2, an anode of the first diode D1 is electrically connected to a cathode of the second diode D2 and the

523, a cathode of the first diode D1 is electrically connected to the fourth power supply V4, and an anode of the second diode D2 is connected to the ground GND.

It should be noted that, when the

300 is powered up and powered down on line, the voltage of the

300 is sampled by the

51, then divided to be lower than 1V by the

51, then the burrs are filtered out by the first capacitor, and the direct current voltage is output by the selecting unit 52, the

54 limits the direct current voltage to be between 0 and 1V, and the measuring

53 performs operation amplification on the direct current voltage and then transmits the amplified direct current voltage to the

100, so as to measure the voltage corresponding to the

300.

It should be noted that, in the embodiment of the present application, the

100 includes, but is not limited to, one of the following: singlechip, PFGA and DSP.

1. A multiple power management system for an integrated circuit tester, for controlling a plurality of power supplies, the multiple power management system comprising: the power-off time sequence control module is connected with the power-off time sequence control module; wherein,

the control module is connected with the power-off time sequence control module and used for generating a power-off signal;

the power-off time sequence control module comprises a plurality of power-off units, the plurality of power-off units are connected in a cascade mode, and the input end of the power-off unit at the first stage in the plurality of power-off units is connected with the control module; the output end of each power-down unit in the plurality of power-down units is respectively connected with at least one power supply in the plurality of power supplies; the power-off unit is used for controlling a power supply connected with the power-off unit to be powered off and sending a signal for powering off to the power-off unit of the next stage under the condition of receiving the power-off signal;

the power-down unit at the first stage in the plurality of power-down units is driven by a voltage within a first set voltage range provided by a power supply of the power-down time sequence control module and a power-down signal generated by the control module, controls the power supply connected with the power-down unit to power down, and provides a voltage within the first set range for the power-down unit at the next stage;

the power supply is connected with the plurality of power-down units, wherein the power-down unit in the middle stage of the plurality of power-down units is driven by the voltage provided by the power-down unit in the previous stage within the first set voltage range and the power-down signal generated by the control module, controls the power supply connected with the power supply to be powered down, and provides the voltage within the first set voltage range for the power-down unit in the next stage;

and the lower electric unit at the final stage in the plurality of lower electric units is driven by the voltage provided by the lower electric unit at the previous stage within the first set voltage range and the lower electric signal generated by the control module to control the power supply connected with the lower electric unit to be powered down.

2. The multiple power management system of an integrated circuit testing machine of claim 1, wherein the power-down unit comprises: a first input terminal, a second input terminal, a first output terminal and a second output terminal; the first input end is connected with the control module; the first output terminal is connected with at least one power supply in the plurality of power supplies; the second output end is connected with the second input end of the power-down unit of the next stage; the second input end of the first-stage power-down unit is connected with a power supply of the power-down time sequence control module, and the voltage of the power supply is within a first set voltage range; wherein,

and the power-down unit is used for controlling the power supply connected with the first output end to be powered down and outputting the voltage in the first set voltage range to the second input end of the power-down unit of the next stage through the second output end under the condition that the voltage of the second input end is in the first set voltage range and the first input end receives the power-down signal.

3. The multiple power management system of an integrated circuit testing machine of claim 2, wherein the lower electronic unit comprises a lower electronic unit and a voltage control subunit, wherein the lower electronic unit comprises the first input, the second input, and the first output; the first output end of the lower electronic unit is connected with the voltage control subunit, and the voltage control subunit comprises the second output end;

the lower electronic unit is used for controlling the power supply connected with the first output end to be powered off and sending a signal for controlling the power supply connected with the first output end to be powered off to the voltage control subunit under the condition that the voltage of the second input end is within a first set voltage range and the first input end receives the power-off signal;

and the voltage control subunit is configured to, when receiving a signal for controlling the power down of the power supply connected to the first output terminal, output a voltage within the first set voltage range to the second input terminal of the power down unit of the next stage through the second output terminal.

4. The system of claim 3, wherein the voltage control subunit comprises a switch and a resistor, the switch comprises a control terminal, an input terminal and an output terminal, wherein the control terminal of the switch is connected to the first output terminal, the input terminal of the switch is connected to the power supply of the power down timing control module after being connected in series with the resistor, and the input terminal of the switch serves as the second output terminal; the output end of the switch tube is grounded;

the switch tube is used for switching on the input end and the output end of the switch tube when the control end of the switch tube receives a signal for controlling the power-off of the power supply connected with the first output end, so that the second output end outputs the voltage within the first set voltage range.

5. The multiple power management system of an integrated circuit testing machine of claim 1, further comprising: a voltage measurement module; wherein,

the voltage measuring module is connected with the plurality of power supplies and the control module and is used for measuring the output voltage of each power supply in the plurality of power supplies;

the control module is used for generating the lower electric signal under the condition that the output voltage of at least one power supply in the plurality of power supplies is not in a second set voltage range.

6. The multiple power management system of an integrated circuit testing machine of claim 1, further comprising: the power-on time sequence control module comprises a plurality of power-on units, the plurality of power-on units are connected in a cascade mode, and the input end of the power-on unit at the first stage in the plurality of power-on units is connected with the control module; the output end of each power-on unit in the plurality of power-on units is respectively connected with at least one power supply in the plurality of power supplies; the power-on unit is used for controlling a power supply connected with the power-on unit to be powered on under the condition of receiving a power-on signal, and sending a signal for powering on to the next power-on unit.

7. The multiple power management system of an integrated circuit testing machine of claim 6, wherein the power-on unit comprises: a third input, a fourth input, and a third output; the third input end of the first-stage power-on unit in the plurality of power-on units is connected with the control module; the third output is connected to at least one of the plurality of power supplies; the third output end is also connected with the third input end of the next-stage power-on unit; wherein,

the fourth input end is used for receiving a signal indicating whether the output voltage of the power supply connected with the third output end is in a second set voltage range or not;

the power-on unit is configured to control the power supply connected to the third output terminal to be powered on and output a power-on signal to a third input terminal of the next power-on unit through the third output terminal when the output voltage of the power supply connected to the third output terminal is within the second set voltage range and the third input terminal receives the power-on signal.

8. The multiple power management system of an integrated circuit testing machine of claim 7, further comprising: a voltage measurement module; the third input end is connected with the control module; the voltage measuring module is connected with the plurality of power supplies and the control module;

the voltage measuring module is used for measuring the output voltage of each power supply in the plurality of power supplies;

the control module is configured to send a signal to the fourth input terminal, where the signal indicates that the output voltage of the power supply connected to the third output terminal is within a second set voltage range, when the output voltage of the power supply connected to the third output terminal is within the second set voltage range.

9. The multiple power management system of an integrated circuit testing machine of claim 7, further comprising: a plurality of voltage measurement modules, wherein each voltage measurement module is respectively used for measuring the output voltage of each power supply in the plurality of power supplies; the fourth input end is connected with a voltage measuring module used for measuring the power supply connected with the third output end.

10. The system of claim 5 or 8, wherein the voltage measurement module comprises: the device comprises a plurality of voltage division units, a selection unit and a measurement unit; the plurality of voltage division units are connected with the selection unit, and the selection unit is connected with the measurement unit; each voltage division unit in the plurality of voltage division units is respectively connected with one power supply in the plurality of power supplies; the selection unit is used for selecting one power supply from the plurality of power supplies to be measured by the measurement unit; the measuring unit is connected with the control module.