CN113014263A - Successive approximation ADC (analog to digital converter) capacitor array and switch logic circuit - Google Patents
- ️Tue Jun 22 2021
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- CN113014263A CN113014263A CN202110257650.4A CN202110257650A CN113014263A CN 113014263 A CN113014263 A CN 113014263A CN 202110257650 A CN202110257650 A CN 202110257650A CN 113014263 A CN113014263 A CN 113014263A Authority
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- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/462—Details of the control circuitry, e.g. of the successive approximation register
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Abstract
The invention discloses a capacitor array and a switch logic circuit of a successive approximation ADC (analog-to-digital converter), which comprise two groups of DAC (digital-to-analog converter) arrays, three comparators and an SAR (synthetic aperture radar) logic circuit; the DAC array adopts a lower plate sampling mode, the lower plate of the capacitor is connected with an input signal for sampling before quantization of each step is started, and meanwhile, the upper plate of the capacitor is connected with the input end of the comparator and is short-circuited to the common-mode voltage VCM; when sampling is completed, the upper polar plate is disconnected from the common-mode voltage VCM, the lower polar plate is disconnected from the input signal, and the lower polar plate is connected to a preset fixed voltage to carry out 2-bit data quantization in the first step; and then the voltage of the lower electrode plate of the capacitor at the step is controlled by an output signal of the SAR logic to generate a threshold value for next quantization. The invention can solve the problem that in the traditional 2b/cycle structure or even a higher-order structure, a period of time is required to be inserted before the comparator works each time to be used as a pre-charging phase for generating different thresholds, and simultaneously, simple switch control logic can be realized.
Description
Technical Field
The invention relates to the technical field of successive approximation type ADCs, in particular to a capacitor array and a switch logic circuit of a successive approximation type ADC.
Background
Modern high-speed communication systems, such as ultra-wideband radio, high-speed serial link, and ethernet transceiver, require analog-to-digital converters with medium resolution and sampling rate of several hundred mega, and the types of high-speed ADCs that are commonly used mainly include a full parallel type (Flash) ADC, a Pipeline type (Pipeline) ADC, and a successive approximation type (SAR) ADC. The 2b/cycle SAR ADC is an idea of combining with FlashADC, a plurality of comparators are introduced into a traditional 1b/cycle 1e SARADC structure, and a multi-bit structure is compared in parallel at one time, so that compared with a 1b/cycle mode, the SAR ADC can achieve the same resolution by fewer comparison times, and the main advantage is that the speed of a successive approximation type ADC is improved.
However, since the conventional 2b/cyc1e SAR ADC is composed of multiple DACs and requires a precharge operation to generate different threshold voltages to complete each comparison, this incurs additional overhead in time and power consumption, which not only reduces the efficiency and speed of conversion, but also makes the architecture more sensitive to temperature and voltage factor variations due to additional phase and logic operations. Especially when the number of bits of the ADC is higher, the time required and the power consumption are more.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides a capacitor array and a switch logic circuit of a successive approximation type ADC (analog-to-digital converter), which can solve the problem that in the traditional 2b/cyc1e structure or even a higher-order structure, a certain time needs to be inserted before a comparator works for generating different thresholds to serve as a precharge phase, and can realize simple switch control logic.
In order to achieve the purpose, the invention adopts the following technical scheme:
a capacitor array and a switch logic circuit of a successive approximation ADC (analog-to-digital converter) comprise two groups of DAC (digital-to-analog converter) arrays, three comparators and an SAR (synthetic aperture radar) logic circuit;
the DAC array comprises 2n+1A unit capacitor having positive and negative differential input terminals each provided with 2nUnit capacitance, n is the number of bits of ADC; each step of quantization process control corresponds to 4 unit capacitors, the unit capacitors corresponding to each step of quantization process control are not repeated, and the capacitor weight correspondingly controlled in the jth step of quantization is
And
the DAC array adopts a lower plate sampling mode, the lower plate of the capacitor is connected with an input signal for sampling before quantization of each step is started, and meanwhile, the upper plate of the capacitor is connected with the input end of the comparator and is short-circuited to the common-mode voltage VCM; when sampling is completed, the upper polar plate is disconnected from the common-mode voltage VCM, the lower polar plate is disconnected from an input signal, the lower polar plate is connected to a preset fixed voltage, threshold reset operation required by first-step quantization comparison is generated while the charge of the lower polar plate is transferred to the upper polar plate, and the comparator starts to work to carry out first-step 2-bit data quantization;
the input end of the SAR logic circuit is connected with the output end of the comparator, the output end of the SAR logic circuit is connected with the lower plate switch grid of the DAC array, each step of the DAC array is quantized, and the voltage of the capacitor lower plate of the step is controlled by the SAR logic output signal to generate a new threshold value required by next quantization.
In order to optimize the technical scheme, the specific measures adopted further comprise:
further, a reset phase after sampling is set to reset the lower plate of the capacitor array to preset fixed reference levels Vrefp and Vrefn;
the three comparators are respectively a first comparator, a second comparator and a third comparator; the lower pole plates of the capacitors at the same phase end and the steps of the first comparator are respectively connected to Vrefp, Vrefn and Vrefp, and the lower pole plates of the capacitors at the opposite phase end and the steps of the first comparator are respectively connected to Vrefn, Vrefp and Vrefn; the lower pole plates of the capacitors at the same phase end and the steps of the third comparator are respectively connected to Vrefn, Vrefp and Vrefn, and the lower pole plates of the capacitors at the opposite phase end and the steps of the third comparator are respectively connected to Vrefp, Vrefn and Vrefp; the in-phase end of the second comparator is connected with the in-phase end of the first comparator, and the inverting end of the second comparator is connected with the inverting end of the third comparator; wherein Vref is Vrefp-Vrefn such that equivalent thresholds of the first comparator, the second comparator, and the third comparator are-1/2 × Vref, 0, and 1/2 × Vref, respectively;
the SAR logic circuit judges the position of Vip-Vin between the three thresholds according to the results of the three comparators to obtain the 2-bit data of the first step;
the low 4-bit capacitance is connected with Vin during sampling, and is connected with Vrefp or Vrefn according to the quantity ratio of 3: 1 during resetting phase so as to construct the total capacitance of integral power of 2 and form the corresponding threshold voltage of the comparator.
Further, three of four capacitors at the lowest bits of the two-terminal DAC of the comparator are connected with Vrefp, and the other capacitor is connected with Vrefn.
Further, two of the differential capacitances of the lowest bit capacitance are connected to the same Vrefp or Vrefn, and the other two are connected to the common mode voltage.
Furthermore, the output quantization result of the SAR logic circuit is connected to the grid of a lower plate switch of the DAC array, and the lower plate level of the capacitor array at the same phase end of the first comparator and the third comparator is subjected to D of the output quantization result<i>Controlling the output quantization result of the lower plate level of the capacitor array at the inverting terminal
And controlling to generate new three threshold values to continuously quantize the signal.
Further, the capacitor array and the switch logic circuit comprise 2M1 comparator with high order capacitance split ratio of (2)M1: 1; m is a positive integer greater than or equal to 2.
The invention has the beneficial effects that:
the invention provides a capacitor array and a switch logic circuit of a 2 b/cycle-oriented Successive Approximation-Register (SAR) Analog-to-Digital Converter (ADC). The circuit respectively generates three different thresholds during each step of quantization through two groups of Digital-to-Analog (DAC) arrays and three comparators, so that the function of outputting 2-bit data in each step is realized. Meanwhile, the invention also realizes extremely simple switch controlThe logic scheme is that the capacitor array is switched by the output of the circuit rear-end part SAR logic circuit, namely the quantization result D of each step<i>Or after it has passed through an inverter
To direct control so that the corresponding threshold value for the next quantization step can be generated.
Drawings
FIG. 1 is a schematic diagram of a capacitor array and a switching logic circuit of a successive approximation ADC.
Fig. 2 is a schematic diagram of a reset phase of the capacitor array.
FIG. 3 is a schematic diagram of the switching phase of the capacitor array.
FIG. 4 is a schematic of a 2b/cycle 8-bit SARADC oriented capacitor array.
FIG. 5 is a schematic diagram of the quantification of 2b/cycle 8-bit SARADC.
FIG. 6 is a schematic diagram of the working timing of a 2b/cycle 8-bit SAR ADC.
Detailed Description
The present invention will now be described in further detail with reference to the accompanying drawings.
It should be noted that the terms "upper", "lower", "left", "right", "front", "back", etc. used in the present invention are for clarity of description only, and are not intended to limit the scope of the present invention, and the relative relationship between the terms and the terms is not limited by the technical contents of the essential changes.
In connection with fig. 1, the present invention refers to a capacitor array and a switch logic circuit of a successive approximation ADC, which comprises two sets of DAC arrays, three comparators and a SAR logic circuit.
The DAC array comprises 2n+1A unit capacitor having positive and negative differential input terminals each provided with 2nUnit capacitance, n is the number of bits of ADC; each step of quantization process control corresponds to 4 unit capacitors, the unit capacitors corresponding to each step of quantization process control are not repeated, and the capacitor weight correspondingly controlled in the jth step of quantization is
And
the DAC array adopts a lower plate sampling mode, the lower plate of the capacitor is connected with an input signal for sampling before quantization of each step is started, and meanwhile, the upper plate of the capacitor is connected with the input end of the comparator and is short-circuited to the common-mode voltage VCM; and when the sampling is completed, the upper plate is disconnected from the common-mode voltage VCM, the lower plate is disconnected from the input signal, the lower plate is connected to a preset fixed voltage, the threshold reset operation required by the first-step quantization comparison is generated while the charge of the lower plate is transferred to the upper plate, and the comparator starts to work to perform the first-step 2-bit data quantization.
The input end of the SAR logic circuit is connected with the output end of the comparator, the output end of the SAR logic circuit is connected with the lower plate switch grid of the DAC array, each step of the DAC array is quantized, and the voltage of the capacitor lower plate of the step is controlled by the SAR logic output signal to generate a new threshold value required by next quantization.
For an n-bit ADC, 2 for each of the positive and negative differential inputsnA total of 2 for each unit capacitor, ADCn+1Unit capacitance, scheme requirement of adopting 2b/cycle
Step quantization operation, the number of the capacitors controlled in each step is 4, the weight of the four capacitors is 4: 3: 1, wherein the weight of the capacitor controlled correspondingly in the
step1 quantization is
The 2 nd step quantizes the corresponding controlled capacitance weight as
By analogy with that
The step quantization corresponds to the controlled capacitance weight of 4 multiplied by 40,4×40,3×40,1×40. The circuit adopts a lower polar plate sampling mode, the lower polar plate of the capacitor is connected with an input signal for sampling before quantization of each step, and the upper polar plate of the capacitor is connected with the input end of the comparator and is in short circuit with the common-mode voltage V at the momentCMThe upper polar plate is disconnected with the V when the sampling is finishedCMThe connection of the lower plates and the disconnection of the lower plates of the two plates and the input signal are changed into connection with a preset fixed voltage, threshold reset operation required by the first step of comparison is generated while the charge of the lower plates is transferred to the upper plates, and the comparator starts to work after the DAC is established to carry out 2-bit data quantization of the first step. The split capacitor method can also be generalized to 3bit/cycle or higher quantization modes, e.g. when used in M bit/cycle, requiring 2 bits in totalM1 comparator with high order capacitance split ratio of (2)MSimilar functions can be realized by 1 to 1.
And after the quantization of the first step is finished, the control of the reset signal on the four capacitors of the step is turned off, and the SAR logic outputs the quantization signal to control the capacitors of the step to generate a new threshold value.
According to the capacitor array of the 2 b/cycle-oriented successive approximation ADC, extra pre-charging operation is not needed in each step of quantization, and only operation similar to that of a traditional SAR ADC is needed, namely, the DAC is controlled by SAR logic output to be switched to perform the next operation, so that the generation of a required new threshold value can be realized, and a large amount of pre-charging time and power consumption are saved. The lower plate of each step capacitor at the same phase end of the CMP1 is respectively connected to Vrefp, Vrefn and Vrefp, while the lower plate of each step capacitor at the opposite phase end of the CMP3 is respectively connected to Vrefn, Vrefp, Vrefn and Vrefn, while the lower plate of each step capacitor at the same phase end of the CMP3 is respectively connected to Vrefp, Vrefn and Vrefn, and the lower plate of each step capacitor at the opposite phase end of the CMP is respectively connected to Vrefp, Vrefn and Vrefp.
Wherein, due to the weight distribution of 4: 3: 1, and assuming Vref ═ Vrefp-Vrefn, in the first placeThe voltage at the non-inverting terminal of CMP1 at the beginning of the step comparison is
The voltage value of the inverting terminal is
The value compared by CMP1 is therefore Vip-VinWhether the +1/2Vref is greater than 0, the equivalent threshold is-1/2 Vref, and the equivalent thresholds of the same CMP2 and CMP3 are 0 and 1/2Vref, so that V can be judged according to the results respectively output by the three comparatorsip-VinThe 2-bit data of the first step is obtained at the position between the three thresholds; the low 4-bit capacitor is connected with V in the sampling phaseinAnd the reset phase is connected with Vrefp or Vrefn according to the ratio of 3: 1 so as to construct the total capacitance of integral power of 2 and form the corresponding threshold voltage of the comparator. In the conversion process until the last step, three of four Cu capacitors at the lowest bits in DAC at two ends of the comparator are connected with Vrefp, and one capacitor is connected with Vrefn. The lowest order capacitance can have many equivalent connections. For example, two of them are connected to Vrefp and the other two are connected to a common mode voltage. Connecting two differential capacitors to the same Vrefp or Vrefn can realize differential zero level by equivalent common mode voltage connection.
And after the quantization result is output in the first step, the control of the reset signal on the four capacitors in the step is turned off, the voltage of the lower electrode plate of the capacitor in the step is controlled by the SAR logic output signal, and a new threshold value is generated. Wherein the output quantization result of SAR logic is connected to the gate of the switch of the lower plate of DAC capacitor array, and the lower plate level of the capacitor array at the same phase terminal of CMP1 and CMP3 is subject to D of the output quantization result<i>Controlling the output quantization result of the lower plate level of the capacitor array at the inverting terminal
Controlling, and then generating new three thresholds according to the same principle to continuously quantize the signal; the significance of the method is that the outputs of the three comparators directly control the corresponding capacitor polesThe plate switch simplifies a logic circuit and further improves the quantization speed.
FIG. 1 is a schematic diagram of an n-bit capacitor array dedicated to this embodiment, and the circuit is composed of two sets of DAC array DAC1, DAC2, and three comparators CMP3, CMP2, and CMP1, which can generate D respectively3<i>、D2<i>、D1<i>The three bits of quantization result are used to control the gate of the capacitor bottom plate switch. n-bit SAR ADC sharing a need
And step quantization operation, wherein each step of quantized controlled capacitors has four capacitors, and each step of capacitors are rearranged into a weight ratio of 4: 3: 1 by a capacitor division method. In addition, the circuit adopts a bottom plate sampling mode, and the bottom plate of the capacitor is connected with the input signal V before the quantization of each step is startedinAnd VipThe connection is sampled, and the capacitor upper polar plate is connected with the input end of the comparator and is short-circuited to the common mode level VCMThe upper polar plate is disconnected with the V when the sampling is finishedCMWhile disconnecting their bottom plates from the input signal, to effect bottom plate charge transfer, so that the comparator's in-phase terminal voltage is VCM-VinAt a voltage of V at the reverse terminalCM-Vip. After the sampling phase, the DAC capacitor array is reset, as shown in fig. 2, before the first step of quantization starts, the capacitor array needs to be reset by preset fixed levels Vrefp and Vrefn, the capacitors at the same phase end of CMP3 are all connected to fixed levels of Vrefn, Vrefp, and Vrefn, and the capacitors at the opposite phase end are connected to fixed levels of Vrefp, Vrefn, and Vrefp; similarly, the lower plates of the same-phase-end step capacitors of CMP1 are connected to Vrefp, Vrefn, and Vrefp, respectively, and the lower plates of the counter-phase-end step capacitors thereof are connected to Vrefn, Vrefp, and Vrefn, respectively, assuming that Vref is Vrefp-Vrefn, the same-phase voltage of CMP1 at the time of the first comparison is equal to Vrefp-Vrefn
At a reverse terminal voltage of
The value compared by CMP1 is therefore Vip-VinWhether + Vref/2 is greater than 0, the equivalent threshold is-Vref/2, and the equivalent thresholds of CMP2 and CMP3 are 0 and Vref/2, respectively, so that V can be determined according to the results output by the three comparators respectivelyip-VinAnd (4) falling at the position between the three thresholds to obtain the 2-bit data of the first step. After the reset phase is finished, the SAR ADC starts each step of conversion, as shown in FIG. 3, in the first step, three bits of quantized output signals D obtained by three comparators are obtained3<1>D2<1>D1<1>The grid of the lower electrode plate switch of the capacitor array at the same phase end of CMP3 and CMP1 is controlled, and further the access signal of the lower electrode plate of the capacitor is controlled to be Vrefp or Vrefn; the gate of the lower plate switch of the capacitor array at the inverting terminal of CMP3 and CMP1 is not of the quantized output signal
And (5) controlling.
As shown in FIG. 4, the lower plate of the 8-bit capacitor array has been connected to a predetermined fixed voltage. When the reference level Vrefp is represented by 1 and Vrefn is represented by 0, the preset fixed voltages accessed by the capacitors at each step of the non-inverting terminal of CMP3 are 0, 1, and 0, and the preset fixed voltages accessed by the capacitors at each step of the inverting terminal of CMP3 are 1, 0, and 1, and similarly, the preset fixed voltage access of CMP1 is shown in fig. 4. Due to the weight distribution of the capacitors 4: 3: 1, and assuming Vref ═ Vrefp-Vrefn, the voltage at the non-inverting terminal of CMP3 at the beginning of the first comparison step is VCM-Vin+64/256 × Vrefp +192/256 × Vrefn, and the voltage value at the inverting terminal is VCM-Vip+192/256 × Vrefp +64/256 × Vrefn, so the value compared by CMP3 is Vip-VinWhether-1/2 XVref is greater than 0, the equivalent threshold is 1/2 XVref, the equivalent thresholds of CMP2 and CMP1 are 0 and-1/2 Vref, and V is determined according to three
equivalent thresholds1/2 XVref, 0 and-1/2 XVref respectively generated by CMP3, CMP2 and CMP1ip-VinAt a position falling between the above three thresholds, obtaining a quantized output result, and using D3<i>D2<i>D1<i>To indicate. A total of four quantization results are produced, namely: 111. 011, 001, 000, wherein 011 represents Vip-VinFalling within the interval of 0 to 1/2 × Vref, the other quantization results are treated similarly, and the 2-bit data of the first step is obtained.
Fig. 5 is a specific quantization process of this embodiment, assuming that the sampled input signal is +201/256 × Vref, the circuit is reset to obtain the threshold required for the first step of comparison, and according to the three thresholds-1/2 × Vref, 0, 1/2 × Vref generated before the first step of quantization, it can be seen that the input signal falls between 1/2 × Vref and Vref, and the output quantization results obtained by the SAR logic circuit at the rear end of the circuit are 1, and 1, respectively denoted as D3<1>、D2<1>、D1<1>The quantization result is used to control the four capacitors of the first step of the capacitor array of FIG. 4, and the quantization result D is used to control the four capacitors of the capacitor array of FIG. 4i<1>(i-1, 2, 3) or after passing through an inverter
The voltage of the lower plate of the capacitor at the same phase end of CMP3 is switched from a preset fixed voltage 0010 to 0000, the voltage of the lower plate of the capacitor at the opposite phase end of CMP3 is switched from a preset fixed voltage 1101 to 1111, the process changes the threshold used for the first comparison step, and accordingly the threshold voltage required for the second comparison step is generated, for example, the voltage value at the same phase end of CMP3 is switched from V to V, and the voltage of the lower plate of the capacitor at the two phase ends of CMP3 and CMP1 is kept unchangedCM-Vin+64/256 XVrefp +192/256 XVrefn to VCM-Vin+16/256 × Vrefp +240/256 × Vrefn, the voltage value of the inverting terminal is from VCM-Vip+192/256 XVrefp +64/256 XVrefn to VCM-Vip+240/256 × Vrefp +16/256 × Vrefn, so the value compared by CMP3 is Vip-Vin-224/256 XVref is greater than 0, the equivalent threshold is 224/256 XVref, the equivalent thresholds for CMP2 and CMP1 are 192/256 XVref and 160/256 XVref, which result in the threshold needed for the second comparison step, with the first one described aboveThe same step comparison process can be carried out, the quantization result is 011 through the SAR logic circuit, and is marked as D3<2>D2<2>D1<2>(ii) a As shown in fig. 4, the quantization result or the quantization result is not connected to the gates of the second-step capacitor bottom plate switches of CMP1 and CMP3, the level of the connected second-step capacitor bottom plate at the same phase end of CMP3 is changed from 0010 to 0011, the level of the connected second-step capacitor bottom plate at the opposite phase end is changed from 0010 to 1100, the equivalent threshold generated by CMP3 is 216/256 × Vref, the equivalent thresholds generated by CMP2 and CMP1 are 208/256 × Vref and 200/256 × Vref, the positions between the three equivalent thresholds where the input signal falls are observed, the quantization result finally output by the SAR logic circuit is 001, and the result is marked as D3<3>D2<3>D1<3>Repeating the above operations to obtain a value close to the input signal, and completing the ADC conversion.
As can be seen from the above detailed description of the quantization process, the 4: 3: 1 capacitance weight distribution can produce the three threshold voltages we need. The predetermined fixed voltages 1101 and 0010 achieve the increase and decrease of the threshold voltage, for example, when the lower plate of the capacitor at the non-inverting terminal of CMP1 in FIG. 4 is connected to the fixed voltage 1101, the upper plate level of the capacitor is VCM-Vin+192/256 × Vrefp +64/256 × Vrefn, if the lower plate is changed to 1111 level, the level of the upper plate will be changed to VCM-Vin+240/256 × Vrefp +16/256 × Vrefp, i.e., the upper plate is increased by a level of 48/256 × Vref. On the contrary, when the lower plate of the capacitor at the non-inverting terminal of CMP1 is connected to the level of 0000, the level of the upper plate becomes VCM-VinThe +48/256 × Vrefp +208/256 × Vrefp, i.e. the upper plate is reduced by 144/256 × Vref, and these increasing and decreasing changes of the fixed voltage just can satisfy the threshold voltage required for each step of comparison.
The above-mentioned processes of sampling, threshold value generation and conversion are performed in the operation sequence of fig. 6, when CKS is at high level, the signal is input to the lower plate of the capacitor array, the circuit starts sampling, then a certain time is passed to wait for the charge to be transferred to the upper plate, then the reset operation before the first bit comparison is started, the reset process is to charge the whole DAC array in fig. 1, that is, in the high level stages of S1, S2, S3 and S4 of CLK _ charge in fig. 6, after the reset is finished, the first bit comparison is started, after the comparison is finished, the turn-off of the S1 reset signal is controlled by a logic circuit, the output quantization result is used to control the circuit to generate a new threshold value, the comparison output result is obtained in turn, and the reset signal corresponding to the current comparison is turned off in turn.
The above is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above-mentioned embodiments, and all technical solutions belonging to the idea of the present invention belong to the protection scope of the present invention. It should be noted that modifications and embellishments within the scope of the invention may be made by those skilled in the art without departing from the principle of the invention.
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CN114584727A (en) * | 2022-01-14 | 2022-06-03 | 西安理工大学 | Capacitor DAC multi-column shared SAR/SS column parallel ADC and application |
CN116208162A (en) * | 2021-11-30 | 2023-06-02 | 合肥本源量子计算科技有限责任公司 | Analog-to-digital converter and quantum computer control system |
CN117713821A (en) * | 2023-12-20 | 2024-03-15 | 灿芯半导体(上海)股份有限公司 | Input common mode level protection circuit applied to ADC lower polar plate sampling |
CN117713820A (en) * | 2023-12-20 | 2024-03-15 | 灿芯半导体(上海)股份有限公司 | ADC lower polar plate sampling circuit |
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