CN117517923A - An integrated circuit power consumption testing system - Google Patents
- ️Tue Feb 06 2024
CN117517923A - An integrated circuit power consumption testing system - Google Patents
An integrated circuit power consumption testing system Download PDFInfo
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- CN117517923A CN117517923A CN202311466443.5A CN202311466443A CN117517923A CN 117517923 A CN117517923 A CN 117517923A CN 202311466443 A CN202311466443 A CN 202311466443A CN 117517923 A CN117517923 A CN 117517923A Authority
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- 238000012360 testing method Methods 0.000 title claims abstract description 49
- 238000012423 maintenance Methods 0.000 claims abstract description 158
- 238000012544 monitoring process Methods 0.000 claims abstract description 10
- 238000007405 data analysis Methods 0.000 claims abstract description 8
- 238000013480 data collection Methods 0.000 claims abstract description 5
- 230000008439 repair process Effects 0.000 claims abstract 13
- 238000004458 analytical method Methods 0.000 claims description 14
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- 238000010835 comparative analysis Methods 0.000 claims 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
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Abstract
本发明公开了一种集成电路功耗测试系统，涉及集成电路功耗测试技术领域，包括数据收集模块、数据分析模块、数据监测模块、维修方案包生成模块、应急维修方案判定模块、维修方案输出用模块和显示终端；解决了系统会针对故障器件对生成多个维修方案进行推荐，但是并没有考虑到集成电路急需进行使用且不存在备用器件的情况，无法对集成电路进行快速维修使得集成电路尽快恢复使用的技术问题；通过数据监测对集成电路中的电子器件进行分析判断，并将其标记为故障器件，通过应急维修方案判定模块对故障器件进行获取，然后根据接收到故障器件类型，对与之对应的应急维修方案进行输出至显示终端。
The invention discloses an integrated circuit power consumption testing system, which relates to the technical field of integrated circuit power consumption testing and includes a data collection module, a data analysis module, a data monitoring module, a maintenance plan package generation module, an emergency maintenance plan determination module, and a maintenance plan output. Use modules and display terminals; solve the problem that the system will generate multiple repair solutions for recommended faulty devices, but does not take into account the urgent need for integrated circuits to be used and the absence of spare devices. The inability to quickly repair integrated circuits makes integrated circuits Technical issues to restore use as soon as possible; analyze and judge the electronic devices in the integrated circuit through data monitoring and mark them as faulty devices, obtain the faulty devices through the emergency maintenance plan determination module, and then determine the faulty devices according to the type of the faulty device received. The corresponding emergency maintenance plan is output to the display terminal.
Description
Technical Field
The invention relates to the technical field of integrated circuit power consumption testing, in particular to an integrated circuit power consumption testing system.
Background
Integrated circuit power consumption test systems are widely used in the fields of integrated circuit design, manufacturing, performance evaluation, and the like. The integrated circuit provides accurate test and analysis for chip power consumption, provides important reference data for engineers, helps the engineers verify design targets, finds potential problems and optimizes the design targets, and refers to a circuit formed by integrating a plurality of electronic devices (such as transistors, resistors, capacitors and the like) and elements such as wires on a semiconductor chip;
however, when testing the power consumption of the integrated circuit, once each electronic device in the integrated circuit fails, the system can recommend to generate a plurality of maintenance schemes for the failed device, but the situations that the integrated circuit needs to be used urgently and no spare devices exist are not considered, and the integrated circuit cannot be quickly maintained so that the integrated circuit is recovered to be used as soon as possible, so that the integrated circuit power consumption testing system is provided.
Disclosure of Invention
The invention aims to provide a power consumption testing system of an integrated circuit, which solves the technical problems that once each electronic device in the integrated circuit fails, the system can recommend the generation of a plurality of maintenance schemes for the failed device, but the integrated circuit is not required to be used in an urgent manner and is not provided with a standby device, and the integrated circuit cannot be quickly maintained so that the integrated circuit is recovered to be used as soon as possible.
The aim of the invention can be achieved by the following technical scheme:
an integrated circuit power consumption testing system, comprising:
the data collection module is used for obtaining historical power consumption test data of each electronic device in the integrated circuit in the time range T and sending the historical power consumption test data to the data analysis module; the time range T refers to a period of 160 days forward from the current time of acquiring data, i.e., t=160;
the data analysis module is used for analyzing the historical power consumption test data of each electronic device in the integrated circuit in the time range T, so as to obtain power consumption intervals corresponding to each electronic device in the integrated circuit, and the power consumption intervals are sent to the data monitoring module through the power consumption intervals;
the data monitoring module is used for acquiring the power consumption of each electronic device in the integrated circuit in real time, carrying out comparison analysis, marking the fault device in each electronic device according to the comparison analysis result, and sending the fault device to the maintenance scheme output module;
the maintenance scheme package generation module is used for performing dequantization analysis and calculation on historical maintenance records of a plurality of maintenance schemes corresponding to each electronic device, obtaining emergency values corresponding to each maintenance scheme of each electronic device according to analysis results, generating maintenance scheme packages corresponding to each electronic device according to the emergency values corresponding to each maintenance scheme, and transmitting the maintenance scheme packages to the emergency maintenance scheme judgment module;
the emergency maintenance scheme judging module is used for receiving the maintenance scheme packages corresponding to the electronic devices respectively, analyzing the maintenance scheme packages, marking the emergency maintenance schemes of the electronic devices respectively, and sending the maintenance scheme packages to the maintenance scheme output module;
and the maintenance scheme output module is used for acquiring each electronic device and the corresponding emergency maintenance scheme thereof, acquiring the fault device at the same time, and outputting the corresponding emergency maintenance scheme to the display terminal according to the type of the received fault device.
As a further scheme of the invention: the specific mode for acquiring the power consumption interval corresponding to each electronic device in the integrated circuit is as follows:
s1: selecting an electronic device as a target component;
s2: obtaining a power consumption test value of a target component in a time range T, and marking the power consumption test value as Ai, wherein i refers to the number corresponding to the power consumption test value, and i is more than or equal to 1;
s3: the method comprises the steps of obtaining duration time corresponding to each power consumption test value Ai of a target component in a time range T, and marking the duration time as B i;
s4: by passing throughFormula (VI)Calculating to obtain a total test power consumption value AB1 of the target component in a time range T;
s5: by the formulaCalculating to obtain power consumption coefficients C1 i corresponding to each test value Ai, wherein i is more than or equal to i 1 and more than or equal to 1, and theta 1 is a preset coefficient;
s5: obtaining the maximum value C1 in each power consumption coefficient C1 i max And maximum C1 min Obtaining C1 max And C1 min The corresponding test values are respectively marked as AC1 and AD1, and power consumption intervals [ AC1, AD 1] corresponding to the target components are formed through the AC1 and the AD1]；
S6: and repeating the steps S1-S5, so as to obtain power consumption intervals [ ACn, ADn ] corresponding to all the electronic devices in the integrated circuit respectively, wherein n refers to the number corresponding to the electronic devices in the integrated circuit, and n is more than or equal to 1.
As a further scheme of the invention: the method for marking the fault device in each electronic device is as follows:
s01: selecting an electronic device as a target component;
s02: continuously obtaining the power consumption of the target component in the time period t1 for j times, and marking the power consumption as Ej, wherein t1=30min, and j is more than or equal to 1;
s03: substituting Ej into a power consumption interval [ ACn1, ADn1] corresponding to a target component, marking the number of values larger than ACn1 in Ej as f1 and the number of values smaller than ADn1 as f2, wherein n is larger than or equal to n1 and larger than or equal to 1;
s04: calculating to obtain an abnormal coefficient FE1 of the target element device through a formula of beta 2 xf1+beta 2 xf2=FE1, marking the target element device as a fault device when FE1 is more than or equal to Y1,
when FE1 is less than Y1, no treatment is performed;
s05: and repeating the steps S01-S04 to judge each electronic device, wherein the beta 1 is more than or equal to beta 2 and the Y1 is preset.
As a further scheme of the invention: the specific mode for generating the maintenance scheme package corresponding to each electronic device is as follows:
s11: the method for obtaining the emergency recommendation indexes of the multiple maintenance schemes of the target component comprises the following specific modes of selecting one electronic component as the target component, obtaining historical maintenance records of the multiple maintenance schemes of the target component through analysis, and obtaining the emergency recommendation indexes of the multiple maintenance schemes of the target component, wherein the emergency recommendation indexes correspond to the multiple maintenance schemes of the target component respectively:
s1111: selecting one of a plurality of maintenance schemes of a target component as a target scheme, acquiring maintenance time consumption of the target scheme each time within a certain maintenance frequency h, and marking the maintenance time consumption as Hh; the value of h is 60 times, and specifically refers to the number of times of use of pushing forward 60 times from the number of times of use at present, and the data of the number of times of use at present for acquiring data are not counted;
s1112: by the formulaCalculating a discrete value W of maintenance time Hh of the target scheme within the using times h, wherein Hp is the average value of maintenance time Hh of the target scheme within the using times h, and h1 is more than or equal to 1 and less than or equal to h;
if W is less than or equal to Y2, taking Hp as the standard maintenance time consumption K1 of the target scheme; if W is>The Y2-set of the catalyst is selected from the group consisting of, the corresponding value of Hh1 is deleted according to the order of values of |hh1-hp| from large to small, recalculating the discrete value W of the residual Hh1 after each deletion, and recording the number o1 of the deleted Hh1 until W is less than or equal to Y2; if o1<Y3, calculating the average value of the residual Hh1, and taking the average value as the standard maintenance time consumption K1 of the target scheme; if o1 is more than or equal to Y3, calculating the average value of the maximum value and the minimum value of the residual Hh as the standard maintenance time K1 of the target scheme, namelyY2 and Y3 are preset values;
s1113: repeating the steps S1111-S1112 to obtain standard maintenance time Kk corresponding to a plurality of maintenance schemes of the target component respectively, wherein k refers to the number of the maintenance schemes corresponding to the target component, and k is not less than 1;
s1114: obtaining the corresponding repairing times and repairing interval duration of each repairing in a certain time range when the target component is repaired by using the target scheme, and marking the repairing times and the repairing interval duration as FXu and XTu in sequence;
s1115: acquiring the average value of all the numerical values meeting the judgment formula L1 in FXu, marking the average value as FU11, marking FU21 as standard repairing times corresponding to a target scheme, and judging that the formula L1 is | FXu-FXp |Y 4;
s1116: acquiring the average value of all the numerical values meeting the judgment formula L2 of XTu, marking the average value as FU2, marking the FU2 as a standard repairing interval corresponding to a target scheme, and judging that the formula L1 is | XTu-XTp |Y 5;
s1117: repeating the steps S1114-S1116, so as to obtain the number of standard repairing times FU1 k and standard repairing intervals FU2k corresponding to the multiple repairing schemes of the target component respectively;
s1118: calculating and obtaining emergency recommended indexes Mk corresponding to a plurality of maintenance schemes of the target component through a formula of beta 3 xFU1k+FU2k x beta 4+Kk x beta 5+ =Mk, and binding the emergency recommended indexes Mk corresponding to the plurality of maintenance schemes of the target component with the target component to generate a maintenance scheme package; the higher the value corresponding to Mk, the higher the emergency recommendation index for the corresponding scheme, where β3+β4+β5=1, and β5> β3> β4;
s12: and repeating the step S11 to obtain emergency values corresponding to the maintenance schemes respectively, and generating maintenance scheme packages corresponding to the electronic devices respectively.
As a further scheme of the invention: the specific mode for marking the emergency maintenance scheme of each electronic device is as follows:
and marking the maintenance scheme corresponding to the maximum emergency recommended index in the maintenance scheme package corresponding to each electronic device as an emergency maintenance scheme of the corresponding electronic device, and binding the emergency maintenance scheme with the corresponding electronic device and outputting the emergency maintenance scheme to the maintenance scheme output module.
As a further scheme of the invention: a display terminal; the emergency maintenance method is used for displaying the emergency maintenance scheme corresponding to the fault device.
The invention has the beneficial effects that:
according to the invention, the electronic devices in the integrated circuit are analyzed and judged through data monitoring, the electronic devices are marked as fault devices, the fault devices are acquired through the emergency maintenance scheme judging module, then the emergency maintenance scheme corresponding to the fault devices is output to the display terminal according to the received fault device types, so that when different electronic devices in the integrated circuit have faults, the electronic devices are required to be used in an emergency mode and no standby devices exist, the corresponding emergency maintenance party can be selected according to the quick maintenance requirements of the different electronic devices in the integrated circuit, the different electronic devices in the integrated circuit can be recovered to be used as soon as possible, and the fault time of the different electronic devices in the integrated circuit is reduced.
Drawings
The invention is further described below with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of a system frame structure of an integrated circuit power consumption testing system according to the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1, the invention is an integrated circuit power consumption testing system, which comprises a data collection module, a data analysis module, a data monitoring module, a maintenance scheme packet generation module, an emergency maintenance scheme judgment module, a maintenance scheme output module and a display terminal;
the data collection module is used for obtaining historical power consumption test data of each electronic device (such as a transistor, a resistor, a capacitor and the like) in the integrated circuit in the time range T and sending the historical power consumption test data to the data analysis module; the time range T refers to a period of 160 days forward from the current time of acquiring data, i.e., t=160;
the data analysis module is used for analyzing the historical power consumption test data of each electronic device in the integrated circuit in the time range T, further obtaining power consumption intervals corresponding to each electronic device in the integrated circuit, and sending the power consumption intervals to the data monitoring module through the power consumption intervals:
the specific mode for acquiring the power consumption interval corresponding to each electronic device in the integrated circuit is as follows:
s1: selecting an electronic device as a target component;
s2: obtaining a power consumption test value of a target component in a time range T, and marking the power consumption test value as Ai, wherein i refers to the number corresponding to the power consumption test value, and i is more than or equal to 1;
s3: the method comprises the steps of obtaining duration time corresponding to each power consumption test value Ai of a target component in a time range T, and marking the duration time as B i;
s4: by the formulaCalculating to obtain a total test power consumption value AB1 of the target component in a time range T;
s5: by the formulaCalculating to obtain power consumption coefficients C1 i corresponding to each test value Ai, wherein i is more than or equal to i 1 and more than or equal to 1, theta 1 is a preset coefficient, and the specific value is drawn up by related staff according to experience;
s5: obtaining the maximum value C1 in each power consumption coefficient C1 i max And maximum C1 min Obtaining C1 max And C1 min The corresponding test values are respectively marked as AC1 and AD1, and power consumption intervals [ AC1, AD 1] corresponding to the target components are formed through the AC1 and the AD1]；
S6: repeating the steps S1-S5 to obtain power consumption intervals [ ACn, ADn ] corresponding to each electronic device in the integrated circuit, wherein n refers to the number corresponding to the electronic devices in the integrated circuit, and n is more than or equal to 1;
the data monitoring module is used for acquiring and comparing and analyzing the power consumption of each electronic device in the integrated circuit in real time, marking the fault device in each electronic device according to the comparison and analysis result, and sending the fault device to the maintenance scheme output module, wherein the mode for marking the fault device in each electronic device is as follows:
s01: selecting an electronic device as a target component;
s02: continuously obtaining the power consumption of the target component in the time period t1 for j times, and marking the power consumption as Ej, wherein t1=30min, and j is more than or equal to 1;
s03: substituting Ej into a power consumption interval [ ACn1, ADn1] corresponding to a target component, marking the number of values larger than ACn1 in Ej as f1 and the number of values smaller than ADn1 as f2, wherein n is larger than or equal to n1 and larger than or equal to 1;
s04: calculating to obtain an abnormal coefficient FE1 of the target element device through a formula of beta 2 xf1+beta 2 xf2=FE1, marking the target element device as a fault device when FE1 is more than or equal to Y1,
when FE1 is less than Y1, no treatment is performed;
s05: the steps S01-S04 are repeated, so that each electronic device can be judged, wherein beta 1 is larger than or equal to beta 2, Y1 is preset, and specific values of beta 1, beta 2 and Y1 are drawn up according to experience by related staff;
the maintenance scheme package generating module is used for performing dequantization analysis and calculation on historical maintenance records of a plurality of maintenance schemes corresponding to each electronic device, obtaining emergency values corresponding to each maintenance scheme of each electronic device according to analysis results, generating maintenance scheme packages corresponding to each electronic device according to the emergency values corresponding to each maintenance scheme, and transmitting the maintenance scheme packages to the emergency maintenance scheme judging module, wherein the specific mode for generating the maintenance scheme packages corresponding to each electronic device is as follows:
s11: selecting an electronic device as a target component, obtaining historical maintenance records of a plurality of maintenance schemes of the target component through analysis, and obtaining emergency recommendation indexes corresponding to the plurality of maintenance schemes of the target component respectively, wherein the specific mode for obtaining the emergency recommendation indexes corresponding to the plurality of maintenance schemes of the target component is as follows:
s1111: selecting one of a plurality of maintenance schemes of a target component as a target scheme, acquiring maintenance time consumption of the target scheme each time within a certain maintenance frequency h, and marking the maintenance time consumption as Hh;
the value of h is 60 times, and specifically refers to the number of times of use of pushing forward 60 times from the number of times of use at present, and the data of the number of times of use at present for acquiring data are not counted;
s1112: by the formulaCalculating a discrete value W of maintenance time Hh of the target scheme within the using times h, wherein Hp is the average value of maintenance time Hh of the target scheme within the using times h, and h1 is more than or equal to 1 and less than or equal to h;
if W is less than or equal to Y2, taking Hp as the standard maintenance time consumption K1 of the target scheme; if W is more than Y2, deleting the corresponding values of Hh1 according to the sequence from the large value to the small value of the values of the I Hh1-Hp I, recalculating the discrete values W of the residual Hh1 after each deletion, and recording the number o1 of the deleted Hh1 until W is less than or equal to Y2;
if o1<Y3, calculating the average value of the residual Hh1, and taking the average value as the standard maintenance time consumption K1 of the target scheme; if o1 is more than or equal to Y3, calculating the average value of the maximum value and the minimum value of the residual Hh as the standard maintenance time K1 of the target scheme, namelyY2 and Y3 are preset values, and the related field staff can set the values according to actual demands;
s1113: repeating the steps S1111-S1112 to obtain standard maintenance time Kk corresponding to a plurality of maintenance schemes of the target component respectively, wherein k refers to the number of the maintenance schemes corresponding to the target component, and k is not less than 1;
s1114: obtaining the corresponding repairing times and repairing interval duration of each repairing in a certain time range when the target component is repaired by using the target scheme, and marking the repairing times and the repairing interval duration as FXu and XTu in sequence;
s1115: acquiring the average value of all the numerical values meeting the judgment formula L1 in FXu, marking the average value as FU11, marking FU21 as standard repairing times corresponding to a target scheme, and judging that the formula L1 is | FXu-FXp |Y 4;
s1116: acquiring the average value of all the numerical values meeting the judgment formula L2 of XTu, marking the average value as FU2, marking the FU2 as a standard repairing interval corresponding to a target scheme, and judging that the formula L1 is | XTu-XTp |Y 5;
s1117: repeating the steps S1114-S1116, so as to obtain the number of standard repairing times FU1 k and standard repairing intervals FU2k corresponding to the multiple repairing schemes of the target component respectively;
s1118: calculating and obtaining emergency recommended indexes Mk corresponding to a plurality of maintenance schemes of the target component through a formula of beta 3 xFU1k+FU2k x beta 4+Kk x beta 5+ =Mk, and binding the emergency recommended indexes Mk corresponding to the plurality of maintenance schemes of the target component with the target component to generate a maintenance scheme package; the higher the value corresponding to Mk, the higher the emergency recommendation index for the corresponding scheme, where β3+β4+β5=1, and β5> β3> β4; here, Y4, Y5, β3, β4 and β5 are preset coefficients, and the staff in the relevant field can set the values according to the actual demands;
s12: repeating the step S112 to obtain emergency values corresponding to the maintenance schemes respectively, and generating maintenance scheme packages corresponding to the electronic devices respectively;
the emergency maintenance scheme judging module is used for receiving the maintenance scheme packages corresponding to the electronic devices respectively, analyzing the maintenance scheme packages, further marking the emergency maintenance schemes of the electronic devices respectively, and simultaneously sending the maintenance scheme packages to the maintenance scheme output module, wherein the specific mode for marking the emergency maintenance schemes of the electronic devices respectively is as follows:
marking the corresponding maintenance scheme with the maximum emergency recommended index in the corresponding maintenance scheme package of each electronic device as an emergency maintenance scheme of the corresponding electronic device, and binding the corresponding electronic device with the corresponding electronic device and outputting the binding to a maintenance scheme output module;
the maintenance scheme output module is used for acquiring each electronic device and the corresponding emergency maintenance scheme thereof, acquiring the fault device at the same time, and outputting the corresponding emergency maintenance scheme to the display terminal according to the type of the received fault device;
a display terminal; the emergency maintenance scheme display device is used for displaying the emergency maintenance scheme corresponding to the fault device, so that relevant personnel can check and implement the emergency maintenance scheme conveniently;
the method comprises the steps of obtaining power consumption intervals corresponding to all electronic devices in an integrated circuit through analysis of historical power consumption test data of all the electronic devices in the integrated circuit within a time range T, obtaining power consumption of all the electronic devices in the integrated circuit in real time, comparing and analyzing, marking fault devices in all the electronic devices according to comparison analysis results, analyzing historical maintenance records of a plurality of maintenance schemes corresponding to all the electronic devices to generate emergency maintenance schemes corresponding to all the electronic devices, obtaining the fault devices through an emergency maintenance scheme judging module, outputting the emergency maintenance schemes corresponding to the fault devices to a display terminal according to the types of the received fault devices, and further enabling when different electronic devices in the integrated circuit fail, under the conditions that the electronic devices need to be used in an emergency mode and no standby devices exist, the electronic devices in the integrated circuit can be selected according to quick maintenance requirements of the different electronic devices in the integrated circuit.
The above formulas are all formulas with dimensionality removed and numerical calculation, the formulas are formulas with the latest real situation obtained by software simulation through collecting a large amount of data, and preset parameters and threshold selection in the formulas are set by those skilled in the art according to the actual situation.
The foregoing is merely specific embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily think about changes or substitutions within the technical scope of the present application, and the changes and substitutions are intended to be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (6)
1.一种集成电路功耗测试系统，其特征在于，包括：1. An integrated circuit power consumption testing system, characterized by including: 数据收集模块，对时间范围T内集成电路中各个电子器件的历史功耗测试数据进行获取，并将其发送至数据分析模块；时间范围T指代为从获取数据的当下起算往前推160天这一时间段，获取数据的当下不计算在内，即T＝160；The data collection module obtains the historical power consumption test data of each electronic device in the integrated circuit within the time range T and sends it to the data analysis module; the time range T refers to 160 days from the moment when the data is obtained. For a period of time, the current time when data is obtained is not included, that is, T=160; 数据分析模块，用于对时间范围T内集成电路中各个电子器件的历史功耗测试数据进行分析，进而获得集成电路中各个电子器件分别对应的功耗区间，并经其发送至数据监测模块；The data analysis module is used to analyze the historical power consumption test data of each electronic device in the integrated circuit within the time range T, and then obtain the power consumption interval corresponding to each electronic device in the integrated circuit, and send it to the data monitoring module; 数据监测模块，用于实时对集成电路中各个电子器件的功耗进行获取并进行对比分析，根据对比分析结果对各个电子器件中的故障器件进行标记，并将其发送至维修方案输出用模块；The data monitoring module is used to obtain and conduct comparative analysis of the power consumption of each electronic device in the integrated circuit in real time, mark the faulty device in each electronic device according to the comparative analysis results, and send it to the maintenance plan output module; 维修方案包生成模块，用于对各个电子器件对应的多个维修方案的历史维修记录进行去量化分析计算，根据分析结果获得各个电子器件的各个维修方案分别对应的应急值，根据各个维修方案分别对应的应急值生成各个电子器件分别对应的维修方案包，并将其传输至应急维修方案判定模块；The maintenance plan package generation module is used to perform quantitative analysis and calculation on the historical maintenance records of multiple maintenance plans corresponding to each electronic device. According to the analysis results, the emergency values corresponding to each maintenance plan of each electronic device are obtained. According to each maintenance plan, respectively The corresponding emergency value generates a maintenance plan package corresponding to each electronic device, and transmits it to the emergency maintenance plan determination module; 应急维修方案判定模块，用于对各个电子器件分别对应的维修方案包进行接收，并对其进行分析，进而对各个电子器件分别对应急维修方案进行标记，同时将其发送至维修方案输出用模块；The emergency maintenance plan determination module is used to receive the maintenance plan package corresponding to each electronic device, analyze it, and then mark the emergency maintenance plan for each electronic device respectively, and at the same time send it to the maintenance plan output module ; 维修方案输出用模块，用于对各个电子器件和其对应的应急维修方案进行获取，同时对故障器件进行获取，然后根据接收到故障器件类型时，对与之对应的应急维修方案进行输出至显示终端。The maintenance plan output module is used to obtain each electronic device and its corresponding emergency maintenance plan, and at the same time obtain the faulty device, and then output the corresponding emergency maintenance plan to the display according to the type of the faulty device received. terminal. 2.根据权利要求1所述的一种集成电路功耗测试系统，其特征在于，获取集成电路中各个电子器件分别对应的功耗区间的具体方式为：2. An integrated circuit power consumption testing system according to claim 1, characterized in that the specific method of obtaining the power consumption intervals corresponding to each electronic device in the integrated circuit is: S1：选取一个电子器件为目标元器件；S1: Select an electronic device as the target component; S2：对目标元器件在时间范围T内的功耗测试数值进行获取，并将其标记为Ai，其中i指代为功耗测试数值对应的数量，i≥1；S2: Obtain the power consumption test value of the target component within the time range T, and mark it as Ai, where i refers to the number corresponding to the power consumption test value, i≥1; S3：获取目标元器件在时间范围T内各个功耗测试数值Ai分别对应的持续时长，并将其分别标记为Bi；S3: Obtain the duration corresponding to each power consumption test value Ai of the target component within the time range T, and mark them as Bi; S4：通过公式计算获得目标元器件在时间范围T内的总测试功耗值AB1；S4: Through formula Calculate and obtain the total test power consumption value AB1 of the target component within the time range T; S5：通过公式计算获得各个测试数值Ai分别对应的功耗系数C1i，其中i≥i 1≥1，θ1为预设系数；S5: Through formula Calculate and obtain the power consumption coefficient C1i corresponding to each test value Ai, where i≥i 1≥1, and θ1 is the preset coefficient; S5：获取各个功耗系数C1 i中的最大值C1 max和最大值C1 min，获取C1max和C1 min，分别对应的测试数值，并经其分别标记为AC1和AD1，通过AC1和AD1组成目标元器件对应的功耗区间[AC1，AD1]；S5: Obtain the maximum value C1 max and the maximum value C1 min of each power consumption coefficient C1 i, obtain the corresponding test values of C1 max and C1 min , and mark them as AC1 and AD1 respectively, and form the target through AC1 and AD1 The corresponding power consumption interval of the component [AC1, AD1]; S6：重复以上步骤S1-S5，即可获得集成电路中各个电子器件分别对应的功耗区间[ACn，ADn]，其中n指代为集成电路中电子器件对应的数量，n≥1。S6: Repeat the above steps S1-S5 to obtain the power consumption range [ACn, ADn] corresponding to each electronic device in the integrated circuit, where n refers to the corresponding number of electronic devices in the integrated circuit, n≥1. 3.根据权利要求2所述的一种集成电路功耗测试系统，其特征在于，对各个电子器件中的故障器件进行标记的方式为：3. An integrated circuit power consumption testing system according to claim 2, characterized in that the method of marking faulty devices in each electronic device is: S01：选取一个电子器件为目标元器件；S01: Select an electronic device as the target component; S02：连续j次获得目标元器件在时间段t1内的功耗，并将其标记为Ej，此处t1＝30min，j≥1；S02: Obtain the power consumption of the target component in the time period t1 for j consecutive times, and mark it as Ej, where t1=30min, j≥1; S03：将Ej代入至目标元器件对应的功耗区间[ACn1，ADn1]中，将Ej中大于ACn1的数值数量标记为f1，小于ADn1的数值数量标记为f2，其中n≥n1≥1；S03: Substitute Ej into the power consumption interval [ACn1, ADn1] corresponding to the target component, mark the number of values in Ej greater than ACn1 as f1, and the number of values less than ADn1 as f2, where n≥n1≥1; S04：通过公式β2×f1+β2×f2＝FE1，计算获得目标元器的异常系数FE1，当FE1≥Y1时，则将目标元器标记为故障器件，当FE1＜Y1时则不做任何处理；S04: Calculate the abnormality coefficient FE1 of the target component through the formula β2×f1+β2×f2=FE1. When FE1≥Y1, mark the target component as a faulty device. When FE1<Y1, no processing will be done. ; S05：重复步骤S01-S04，即可对各个电子器件进行判断，此处β1≥β2，Y1预设值。S05: Repeat steps S01-S04 to judge each electronic device, here β1≥β2, Y1 default value. 4.根据权利要求3所述的一种集成电路功耗测试系统，其特征在于，生成各个电子器件分别对应的维修方案包的具体方式为：4. An integrated circuit power consumption testing system according to claim 3, characterized in that the specific method of generating maintenance solution packages corresponding to each electronic device is: S11：选取一个电子器件为目标元器件通过分析获得目标元器件多个维修方案的历史维修记录获得，目标元器件多个维修方案分别对应的应急推荐指数，获得目标元器件多个维修方案分别对应的应急推荐指数的具体方式为：S11: Select an electronic device as the target component and obtain the historical maintenance records of multiple maintenance plans for the target component through analysis. The emergency recommendation index corresponding to the multiple maintenance plans of the target component is obtained, and the corresponding emergency recommendation index for the multiple maintenance plans of the target component is obtained. The specific method of emergency recommendation index is: S1111：从目标元器件的多个维修方案中选取一个作为目标方案，获取目标方案在一定维修次数h内每次的维修耗时，并将其标记为Hh；此处h的取值为60次，具体指代为从当下使用次数起算，往前推60次的这一使用次数，获取数据的当下使用次数的数据不计入在内；S1111: Select one of the multiple maintenance plans for the target component as the target plan, obtain the maintenance time of each maintenance plan for the target plan within a certain number of repairs h, and mark it as Hh; the value of h here is 60 times , specifically refers to the number of uses calculated from the current number of uses and pushed forward 60 times, and the data of the current number of uses when the data is obtained is not included; S1112：通过公式计算在使用次数h内目标方案维修耗时Hh的离散值W，其中Hp为目标方案在使用次数h内维修耗时Hh的均值，1≤h1≤h；S1112: Pass formula Calculate the discrete value W of the maintenance time Hh of the target solution within the number of uses h, where Hp is the average maintenance time Hh of the target solution within the number of uses h, 1≤h1≤h; 若W≤Y2，则将Hp作为目标方案的标准维修耗时K1；若W>Y2，则根据|Hh1-Hp|的值从大到小的顺序将对应的Hh1的值进行删除，并在每次删除后对剩余Hh1的离散值W进行重新计算，同时对删除的Hh1的个数o1进行记录，直至满足W≤Y2；若o1<Y3，则计算剩余Hh1的均值，并将其作为目标方案的标准维修耗时K1；若o1≥Y3则计算剩余Hh最大值和最小值的均值作为目标方案的标准维修耗时K1，即此处Y2和Y3为预设数值；If W ≤ Y2, then Hp is used as the standard maintenance time K1 of the target solution; if W > Y2, then the corresponding Hh1 values are deleted in descending order according to the values of |Hh1-Hp|, and each time After deletion, the discrete value W of the remaining Hh1 is recalculated, and the number o1 of the deleted Hh1 is recorded until W ≤ Y2 is satisfied; if o1 < Y3, the mean value of the remaining Hh1 is calculated and used as the target solution The standard maintenance time K1 of Here Y2 and Y3 are preset values; S1113：重复以上步骤S1111-S1112，即可获得目标元器件的多个维修方案分别对应的标准维修耗时Kk，其中k指代为目标元器件对应的维修方案的数量，1≤k；S1113: Repeat the above steps S1111-S1112 to obtain the standard maintenance time Kk corresponding to multiple maintenance plans of the target component, where k refers to the number of maintenance plans corresponding to the target component, 1≤k; S1114：获取使用目标方案在对目标元器件进行维修时在一定时间范围内对应的复修次数和每次复修对应的复修间隔时长，并将其依次标记为FXu和XTu；S1114: Obtain the corresponding number of repairs and the repair interval corresponding to each repair within a certain time range when using the target solution to repair the target component, and mark them as FXu and XTu in sequence; S1115：获取FXu中所有满足判定公式L1的数值的均值，并将其标记为FU11，将FU21标记为目标方案对应的标准复修次数，判定公式L1为|FXu-FXp|≤Y4；S1115: Obtain the mean value of all values in FXu that satisfy the judgment formula L1, and mark it as FU11, and mark FU21 as the standard number of repairs corresponding to the target solution. The judgment formula L1 is |FXu-FXp|≤Y4; S1116：获取到XTu所有满足判定公式L2的数值的均值，并将其标记为FU2，将FU2标记为目标方案对应的标准复修间隔，判定公式L1为|XTu-XTp|≤Y5；S1116: Obtain the mean value of all XTu values that satisfy the judgment formula L2, and mark it as FU2. Mark FU2 as the standard repair interval corresponding to the target solution. The judgment formula L1 is |XTu-XTp|≤Y5; S1117：重复以上步骤S1114-S1116，即可获得目标元器件的多个维修方案分别对应的数量标准复修次数FU1 k和标准复修间隔FU2k；S1117: Repeat the above steps S1114-S1116 to obtain the number of standard repair times FU1k and standard repair interval FU2k corresponding to multiple repair plans for the target component; S1118：通过公式β3×FU1 k+FU2k×β4+Kk×β5+＝Mk，计算获得目标元器件的多个维修方案分别对应的应急推荐指数Mk，同时将目标元器件的多个维修方案分别对应的应急推荐指数Mk与目标元器件进行绑定生成维修方案包；Mk对应的值越高表示对应方案的应急推荐指数越高，其中β3+β4+β5＝1，且β5>β3>β4；S1118: Through the formula β3×FU1 k+FU2k×β4+Kk×β5+=Mk, calculate and obtain the emergency recommendation index Mk corresponding to multiple maintenance plans of the target component, and at the same time, calculate the corresponding emergency recommendation index Mk of the multiple maintenance plans of the target component. The emergency recommendation index Mk is bound to the target component to generate a maintenance solution package; the higher the value corresponding to Mk, the higher the emergency recommendation index of the corresponding solution, where β3+β4+β5=1, and β5>β3>β4; S12：重复上述步骤S11即可获得各个维修方案分别对应的应急值，并生成各个电子器件分别对应的维修方案包。S12: Repeat the above step S11 to obtain the emergency values corresponding to each maintenance plan, and generate a maintenance plan package corresponding to each electronic device. 5.根据权利要求4所述的一种集成电路功耗测试系统，其特征在于，对各个电子器件分别对应急维修方案进行标记的具体方式为：5. An integrated circuit power consumption testing system according to claim 4, characterized in that the specific method of marking emergency maintenance plans for each electronic device is: 将各个电子器件分别对应的维修方案包中具有最大应急推荐指数对应的维修方案标注为对应电子器件的应急维修方案，并将其与对应电子器件进行绑定输出至维修方案输出用模块。Mark the maintenance plan corresponding to the maximum emergency recommendation index in the maintenance plan package corresponding to each electronic device as the emergency maintenance plan for the corresponding electronic device, and bind it with the corresponding electronic device and output it to the maintenance plan output module. 6.根据权利要求1所述的一种集成电路功耗测试系统，其特征在于，显示终端；用于对故障器件对应的应急维修方案进行显示。6. An integrated circuit power consumption testing system according to claim 1, characterized in that the display terminal is used to display the emergency repair plan corresponding to the faulty device.
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Denomination of invention: A power consumption testing system for integrated circuits Granted publication date: 20240618 Pledgee: China Construction Bank Corporation Changzhou Wujin sub branch Pledgor: Changzhou Zechen Electronic Technology Co.,Ltd. Registration number: Y2025980001211 |