TWI512303B - Hot plugging device for establishing and testing data channel by switching protocol automatically and method thereof - Google Patents

自動切換協議以建立並測試資料通道之熱插拔裝置及方法Hot swapping device and method for automatically switching protocols to establish and test data channels

一種熱插拔裝置及其使用方法，特別係指一種自動切換協議以建立並測試資料通道之熱插拔裝置及方法。A hot plug device and method of use thereof, in particular, a hot swap device and method for automatically switching protocols to establish and test data channels.

目前主機中某個特定的連接介面可能支援多個不同規格的協議，例如，目前大多數電腦的USB連接介面都支援USB 2.0或USB 3.0的協議，使得與該電腦連接的USB裝置可以使用USB 2.0或USB 3.0的協議與該電腦建立資料通道。不過，對於電腦的製造商而言，在電腦製作完成後，若需要測試支援不同協議的連接介面，則需要使用支援不同協議的裝置與電腦連接，如此，測試的過程並無法自動執行。At present, a specific connection interface in the host may support multiple protocols of different specifications. For example, the USB connection interface of most computers currently supports the USB 2.0 or USB 3.0 protocol, so that the USB device connected to the computer can use USB 2.0. Or the USB 3.0 protocol establishes a data channel with the computer. However, for the manufacturer of the computer, if the connection interface supporting different protocols needs to be tested after the computer is completed, it is necessary to connect to the computer using a device supporting different protocols, and thus the test process cannot be automatically performed.

為了要能夠自動完成支援不同協議之連接介面的測試，目前有廠商開發出使用支援熱插拔(Hot swapping/Hot plugging)之功能的裝置(以下將稱為「熱插拔裝置」)來進行測試。該等熱插拔裝置在以第一種協議與電腦建立資料通道後，會重置(reset)熱插拔裝置中的控制器，藉以讓該等熱插拔裝置可以再以第二種協議與電腦建立資料通道，接著重複同樣的動作，直到所有支援的協議都被使用過為止。然而，重置熱插拔裝置之控制器的方式具有一定程度的風險。In order to be able to automatically test the connection interface supporting different protocols, some manufacturers have developed a device that uses the function of hot swapping/Hot plugging (hereinafter referred to as "hot plugging device") for testing. . The hot plugging device resets the controller in the hot plugging device after establishing the data channel with the computer by the first protocol, so that the hot plugging device can be further configured with the second protocol. The computer establishes a data channel and then repeats the same action until all supported protocols have been used. However, the manner in which the controller of the hot plug device is reset has a certain degree of risk.

另外，除了上述對連接介面所支援之協議進行測試之外，還可以將連接介面的資料傳送腳位與資料接收腳位直接連接，藉以測試連接介面的資料傳輸是否正確。但這樣的測試並無法偵測連接介面的資料傳輸錯誤率，也無法進行傳輸壓力測試，也就是說，這樣的測試並不完整。In addition, in addition to testing the protocol supported by the connection interface, the data transmission pin of the connection interface can be directly connected with the data receiving pin to test whether the data transmission of the connection interface is correct. However, such a test does not detect the data transmission error rate of the connection interface, nor can it perform the transmission stress test, that is, such a test is not complete.

綜上所述，可知先前技術中長期以來一直存在無法對連接介面進行完整且有效率之測試的問題，因此有必要提出改進的技術手段，來 解決此一問題。In summary, it can be seen that there has been a long-standing problem in the prior art that the connection interface cannot be tested completely and efficiently, so it is necessary to propose improved technical means. Solve this problem.

有鑒於先前技術存在無法對連接介面進行完整且有效率之測試的問題，本發明遂揭露一種自動切換協議以建立並測試資料通道之熱插拔裝置及方法，其中：本發明所揭露之自動切換協議以建立並測試資料通道之熱插拔裝置，至少包含：控制模組，用以使用第一協議使熱插拔裝置與待測主機建立資料通道，使用第二協議使熱插拔裝置與待測主機建立資料通道，及用以重新啟動熱插拔裝置，藉以模擬熱插拔之行為；接收模組，用以接收待測主機所傳送之第一測試資料，其中，第一測試資料之資料長度可使待測主機以第一協議定義之最大傳送速度傳送第一測試資料達到第一預定時間，及用以接收待測主機所傳送之第二測試資料，其中，第二測試資料之資料長度可使待測主機以第二協議定義之最大傳送速度傳送第二測試資料達到第二預定時間；傳送模組，用以傳送所接收到之第一測試資料至待測主機，及用以傳送退出訊息至待測主機，及用以傳送所接收到之第二測試資料至待測主機。In view of the prior art, there is a problem that the connection interface cannot be tested completely and efficiently. The present invention discloses an automatic switching protocol for establishing and testing a data channel hot plugging apparatus and method, wherein: the automatic switching disclosed by the present invention The protocol is to establish and test a hot plug device for the data channel, and at least includes: a control module, configured to use the first protocol to establish a data channel between the hot plug device and the host to be tested, and use the second protocol to enable the hot plug device The test host establishes a data channel, and is used to restart the hot plug device to simulate hot plugging behavior; the receiving module is configured to receive the first test data transmitted by the host to be tested, wherein the data of the first test data The length allows the host to be tested to transmit the first test data to the first predetermined time at the maximum transmission speed defined by the first protocol, and to receive the second test data transmitted by the host to be tested, wherein the data length of the second test data The host to be tested can transmit the second test data to the second predetermined time at the maximum transmission speed defined by the second protocol; the transmission module, The first test data to transmit to the host received the test, and for transmitting the test message to exit the host, and for the second test data transmitted to the host received the test.

本發明所揭露之自動切換協議以建立並測試資料通道之方法，其步驟至少包括：熱插拔裝置使用第一協議與待測主機建立資料通道；熱插拔裝置接收待測主機所傳送之第一測試資料，第一測試資料之資料長度可使待測主機以第一協議定義之最大傳送速度傳送第一測試資料達到第一預定時間；熱插拔裝置傳送所接收到之第一測試資料至待測主機；熱插拔裝置傳送退出訊息至待測主機；熱插拔裝置重新啟動，藉以模擬熱插拔之行為；熱插拔裝置使用第二協議與待測主機建立資料通道；熱插拔裝置接收待測主機所傳送之第二測試資料，第二測試資料之資料長度可使待測主機以第二協議定義之最大傳送速度傳送第二測試資料達到第二預定時間；熱插拔裝置傳送所接收到之第二測試資料至待測主機。The method for establishing and testing a data channel by the automatic switching protocol disclosed in the present invention includes the steps of: the hot plugging device establishes a data channel with the host to be tested by using the first protocol; and the hot plugging device receives the data transmitted by the host to be tested. a test data, the data length of the first test data enables the host to be tested to transmit the first test data to the first predetermined time at the maximum transfer speed defined by the first protocol; the hot plug device transmits the received first test data to The host to be tested; the hot plug device transmits the exit message to the host to be tested; the hot plug device restarts to simulate the hot plugging behavior; the hot plug device uses the second protocol to establish a data channel with the host to be tested; The device receives the second test data transmitted by the host to be tested, and the data length of the second test data enables the host to be tested to transmit the second test data to the second predetermined time at the maximum transmission speed defined by the second protocol; the hot plug device transmits The second test data received is sent to the host to be tested.

本發明所揭露之熱插拔裝置與方法如上，與先前技術之間的差異在於本發明透過熱插拔裝置在使用第一協議與待測主機建立資料通道 後，接收待測主機所傳送的測試資料，並依據所傳送的測試資料對待測主機的連接介面進行測試，並在完成測試後，重新啟動熱插拔裝置，藉以讓熱插拔裝置繼續使用第二協議與待測主機建立資料通道，並依據待測主機再次傳送之測試資料對待測主機的連接介面進行測試，藉以解決先前技術所存在的問題，並可以達成自動對待測主機之連接介面進行完整測試的技術功效。The hot plug device and method disclosed in the present invention are as above, and the difference from the prior art is that the present invention establishes a data channel with the host to be tested by using the first protocol through the hot plug device. After receiving the test data transmitted by the host to be tested, and testing the connection interface of the host to be tested according to the transmitted test data, and after completing the test, restarting the hot plug device, so that the hot plug device continues to use the first The second protocol establishes a data channel with the host to be tested, and tests the connection interface of the host to be tested according to the test data transmitted by the host to be tested, so as to solve the problems existing in the prior art, and can complete the connection interface of the automatic test host. The technical efficacy of the test.

100‧‧‧熱插拔裝置100‧‧‧hot plugging device

110‧‧‧控制模組110‧‧‧Control Module

120‧‧‧接收模組120‧‧‧ receiving module

121‧‧‧接收緩衝區121‧‧‧ Receive buffer

130‧‧‧傳送模組130‧‧‧Transmission module

131‧‧‧傳送緩衝區131‧‧‧Transfer buffer

150‧‧‧錯誤偵測模組150‧‧‧Error Detection Module

160‧‧‧位元計算模組160‧‧‧ bit calculation module

400‧‧‧待測主機400‧‧‧Host to be tested

402‧‧‧連接介面402‧‧‧Connection interface

步驟210‧‧‧熱插拔裝置使用第一協議與待測主機建立資料通道Step 210‧‧‧The hot-swappable device establishes a data channel with the host to be tested using the first protocol

步驟220‧‧‧熱插拔裝置接收待測主機所傳送之第一測試資料，第一測試資料之資料長度可使待測主機以第一協議定義之最大傳輸速度傳送第一測試資料達到第一預定時間Step 220‧‧ The hot plugging device receives the first test data transmitted by the host to be tested, and the data length of the first test data enables the host to be tested to transmit the first test data to the first at the maximum transmission speed defined by the first protocol. scheduled time

步驟230‧‧‧熱插拔裝置傳送所接收到之第一測試資料至待測主機Step 230‧‧‧The hot plug device transmits the received first test data to the host to be tested

步驟240‧‧‧熱插拔裝置傳送退出訊息至待測主機Step 240‧‧‧The hot plug device sends an exit message to the host to be tested

步驟250‧‧‧熱插拔裝置重新啟動，藉以模擬熱插拔之行為Step 250‧‧‧The hot-swap device is restarted to simulate hot-swap behavior

步驟260‧‧‧熱插拔裝置使用第二協議與待測主機建立資料通道Step 260‧‧‧The hot plug device uses the second protocol to establish a data channel with the host to be tested

步驟270‧‧‧熱插拔裝置接收待測主機所傳送之第二測試資料，第二測試資料之資料長度可使待測主機以第二協議定義之最大傳輸速度傳送第二測試資料達到第二預定時間Step 270‧‧ The hot plug device receives the second test data transmitted by the host to be tested, and the data length of the second test data enables the host to be tested to transmit the second test data to the second at the maximum transmission speed defined by the second protocol. scheduled time

步驟280‧‧‧熱插拔裝置傳送所接收到之第二測試資料至待測主機Step 280‧‧ The hot plugging device transmits the received second test data to the host to be tested

步驟310‧‧‧熱插拔裝置儲存測試資料至接收緩衝區Step 310‧‧‧Hot-plugging device stores test data to the receive buffer

步驟330‧‧‧熱插拔裝置依據測試資料中所包含之錯誤位元判斷待測主機傳送資料之正確性Step 330‧‧‧The hot-swappable device judges the correctness of the data transmitted by the host to be tested based on the error bits included in the test data

步驟350‧‧‧熱插拔裝置依據測試資料於接收緩衝區中之接收時間與資料長度計算該待測主機之資料傳送速率Step 350‧‧‧ The hot plugging device calculates the data transfer rate of the host to be tested according to the receiving time and the data length of the test data in the receiving buffer

步驟370‧‧‧熱插拔裝置由接收緩衝區複製測試資料至傳送緩衝區Step 370‧‧‧The hot-swappable device copies the test data from the receive buffer to the transmit buffer

步驟390‧‧‧熱插拔裝置依據測試資料於傳送緩衝區中之傳送時間與資料長度計算該待測主機之資料接收速率Step 390‧‧‧ The hot plugging device calculates the data receiving rate of the host to be tested according to the transmission time and the data length of the test data in the transmission buffer

第1圖為本發明所提之自動切換協議以建立並測試資料通道之熱插拔裝置之元件示意圖。Figure 1 is a schematic diagram of the components of the hot swap device for establishing and testing data channels in accordance with the automatic switching protocol of the present invention.

第2圖為本發明所提之自動切換協議以建立並測試資料通道之方法流程圖。2 is a flow chart of a method for establishing and testing a data channel by the automatic handover protocol proposed by the present invention.

第3A圖為本發明所提之接收測試資料並測試之附加方法流程圖。FIG. 3A is a flow chart of an additional method for receiving test data and testing according to the present invention.

第3B圖為本發明所提之傳送測試資料並測試之附加方法流程圖。FIG. 3B is a flow chart of an additional method for transmitting test data and testing according to the present invention.

以下將配合圖式及實施例來詳細說明本發明之特徵與實施方式，內容足以使任何熟習相關技藝者能夠輕易地充分理解本發明解決技術問題所應用的技術手段並據以實施，藉此實現本發明可達成的功效。The features and embodiments of the present invention will be described in detail below with reference to the drawings and embodiments, which are sufficient to enable those skilled in the art to fully understand the technical means to which the present invention solves the technical problems, and The achievable effects of the present invention.

本發明可以對待測主機上的連接介面進行資料傳送的相關測試，其中包含資料傳送壓力測試、最大資料傳送速率的測試、資料傳送正確率的測試等。其中，進行測試的連接介面具有熱插拔之功能，也就是說，連接介面包含但不限於USB介面、SATA介面等。The invention can carry out related tests for data transmission of the connection interface on the host to be tested, and includes a data transmission stress test, a maximum data transmission rate test, and a data transmission correct rate test. The connection interface for testing has the function of hot plugging, that is, the connection interface includes but is not limited to a USB interface, a SATA interface, and the like.

以下先以「第1圖」本發明所提之自動切換協議以建立並測試資料通道之熱插拔裝置之元件示意圖來說明本發明的系統運作。如「第1 圖」所示，本發明之熱插拔裝置100含有控制模組110、接收模組120、以及傳送模組130。另外，本發明之熱插拔裝置100也可以包含可附加的錯誤偵測模組150以及位元計算模組160。In the following, the system operation of the present invention will be described first by using the automatic switching protocol proposed by the present invention in "Fig. 1" to establish and test the component diagram of the hot swap device of the data channel. Such as "1st As shown in the figure, the hot plug device 100 of the present invention includes a control module 110, a receiving module 120, and a transfer module 130. In addition, the hot plug device 100 of the present invention may also include an additional error detection module 150 and a bit calculation module 160.

控制模組110負責使用與待測主機400之連接介面402所使用的協議連接熱插拔裝置100與待測主機400。例如，當連接介面402為USB介面時，控制模組110可以使用USB 3.0的協議以及USB 2.0的協議與待測主機400連接。The control module 110 is responsible for connecting the hot plug device 100 and the host 400 to be tested using a protocol used by the connection interface 402 of the host 400 to be tested. For example, when the connection interface 402 is a USB interface, the control module 110 can be connected to the host 400 to be tested using a protocol of USB 3.0 and a protocol of USB 2.0.

控制模組110也負責重新啟動熱插拔裝置100，藉以模擬熱插拔之行為，也就是模擬使用者將熱插拔裝置100拔離待測主機400之連接介面402後，再次將熱插拔裝置100插入連接介面402或將連接介面插入熱插拔裝置100的行為。The control module 110 is also responsible for restarting the hot plug device 100, thereby simulating the hot plugging behavior, that is, the simulation user pulls the hot plug device 100 out of the connection interface 402 of the host 400 to be tested, and then hot swaps again. The device 100 is inserted into the connection interface 402 or inserts the connection interface into the hot plug device 100.

在部分的實施例中，控制模組110可以先中斷當前與該待測主機所建立之資料通道，並停止熱插拔裝置100與待測主機400間之所有電氣訊號，使得待測主機400無法偵測到熱插拔裝置100而判斷熱插拔裝置100已經移除，而後控制模組110會在經過一段時間(在本發明中稱此段時間為「預定時間」)後，恢復熱插拔裝置100與待測主機400間之所有電氣訊號，使得待測主機400重新偵測到熱插拔裝置100的訊號而判斷熱插拔裝置100重新連接，藉以模擬熱插拔的行為，但本發明並不以此為限。In some embodiments, the control module 110 may first interrupt the data channel currently established by the host to be tested, and stop all electrical signals between the hot plug device 100 and the host 400 to be tested, so that the host 400 to be tested cannot be tested. When the hot plug device 100 is detected and it is determined that the hot plug device 100 has been removed, the control module 110 resumes hot swap after a period of time (referred to as "predetermined time" in the present invention). The electrical signals between the device 100 and the host 400 to be tested are such that the host 400 to be tested re-detects the signal of the hot plug device 100 and determines that the hot plug device 100 is reconnected, thereby simulating the hot plugging behavior, but the present invention Not limited to this.

接收模組120負責接收待測主機400所傳送的測試資料(在本發明中，將以「測試資料」表示第一測試資料或第二測試資料)。其中，第一測試資料的資料長度可以讓待測主機400以第一協議所定義的最大傳送速度傳送第一測試資料時，仍然需要傳送一段時間才能完整的傳送第一測試資料，在本發明中，從待測主機400開始傳送第一測試資料到待測主機400完成第一測試資料的傳送所經過的時間被稱為「第一預定時間」，相似的，第二測試資料的資料長度可以讓待測主機400以第二協議所定義的最大傳送速度傳送第二測試資料時，仍然需要傳送一段時間才能完整的傳送第二測試資料，在本發明中，從待測主機400開始傳送第二測試資料到待測主機400完成第二測試資料的傳送所經過的時間被稱為「第二預定時間」。The receiving module 120 is responsible for receiving the test data transmitted by the host 400 to be tested (in the present invention, the first test data or the second test data will be represented by "test data"). Wherein, the data length of the first test data allows the host to be tested 400 to transmit the first test data at the maximum transfer speed defined by the first protocol, and still needs to transmit for a period of time to completely transmit the first test data, in the present invention. The time elapsed after the first test data is transmitted from the host 400 to be tested to the host 400 to complete the transmission of the first test data is referred to as a "first predetermined time". Similarly, the data length of the second test data can be When the host 400 to be tested transmits the second test data at the maximum transmission speed defined by the second protocol, it still needs to be transmitted for a period of time to completely transmit the second test data. In the present invention, the second test is transmitted from the host 400 to be tested. The elapsed time from the data to the host to be tested 400 to complete the transmission of the second test data is referred to as a "second predetermined time."

一般而言，接收模組120可以包含接收緩衝區(buffer)121，接收緩衝區121負責儲存接收模組120所接收的測試資料。In general, the receiving module 120 can include a receiving buffer 121, and the receiving buffer 121 is responsible for storing the test data received by the receiving module 120.

傳送模組130負責將接收模組120所接收到的測試資料傳回待測主機400。傳送模組130也負責傳送表示熱插拔裝置100將要拔離待測主機400的退出訊息至待測主機400。The transmitting module 130 is responsible for transmitting the test data received by the receiving module 120 to the host 400 to be tested. The transmitting module 130 is also responsible for transmitting an exit message indicating that the hot plug device 100 is to be pulled out of the host 400 to be tested to the host 400 to be tested.

一般而言，傳送模組130可以包含傳送緩衝區131，傳送緩衝區131負責儲存由接收緩衝區121複製的測試資料，也就是說，在接收緩衝區121完成接收模組120所接收到之完整測試資料的儲存後，傳送緩衝區131也會儲存一份與接收緩衝區121所儲存之完整測試資料相同的資料，藉以提供傳送模組130傳送。在部分的實施例中，測試資料由接收緩衝區121被複製到傳送緩衝區是由控制模組110所進行，但本發明並不以此為限。In general, the transmission module 130 may include a transmission buffer 131, and the transmission buffer 131 is responsible for storing the test data copied by the receiving buffer 121, that is, completing the receiving module 120 in the receiving buffer 121. After the test data is stored, the transfer buffer 131 also stores a piece of the same data as the complete test data stored in the receive buffer 121, thereby providing the transfer module 130 for transmission. In some embodiments, the test data is copied from the receive buffer 121 to the transmit buffer by the control module 110, but the invention is not limited thereto.

錯誤偵測模組150負責依據測試資料中所包含之錯誤位元(error bit)判斷待測主機400傳送資料的正確率及/或錯誤率等與傳送資料之正確性相關的資訊。The error detection module 150 is responsible for determining the information related to the correctness of the transmitted data, such as the correct rate and/or error rate of the data transmitted by the host 400 to be tested, based on the error bit included in the test data.

位元計算模組160負責依據測試資料被完整儲存到接收緩衝區121中的時間(在本發明中被稱為「接收時間」)與測試資料的資料長度計算待測主機400的資料傳送速率，以及負責依據在傳送緩衝區131中之測試資料被完整傳送的時間(在本發明中被稱為「傳送時間」)與測試資料的資料長度計算待測主機400的資料接收速率。The bit calculation module 160 is responsible for calculating the data transfer rate of the host 400 to be tested based on the time when the test data is completely stored in the receive buffer 121 (referred to as "reception time" in the present invention) and the data length of the test data. And it is responsible for calculating the data reception rate of the host 400 to be tested based on the time when the test data in the transmission buffer 131 is completely transmitted (referred to as "transmission time" in the present invention) and the data length of the test data.

接著以一個實施例來解說本發明的運作系統與方法，並請參照「第2圖」本發明所提之自動切換協議以建立並測試資料通道之方法流程圖。在本實施例中，假設連接介面402為USB介面，其可以使用USB 2.0與USB 3.0的協議與熱插拔裝置100連接。Next, an operational system and method of the present invention will be described with reference to an embodiment, and reference is made to the flowchart of the method for establishing and testing a data channel according to the "2nd drawing" of the present invention. In the present embodiment, it is assumed that the connection interface 402 is a USB interface, which can be connected to the hot plug device 100 using a protocol of USB 2.0 and USB 3.0.

當使用者希望測試待測裝置400的連接介面402時，首先需要將熱插拔裝置100插入連接介面402，或將連接介面402插入熱插拔裝置100，藉以完成待側裝置400與熱插拔裝置100的連接。When the user wants to test the connection interface 402 of the device under test 400, the hot plug device 100 needs to be inserted into the connection interface 402, or the connection interface 402 is inserted into the hot plug device 100, thereby completing the to-side device 400 and hot plugging. Connection of device 100.

之後，熱插拔裝置100中的控制模組110可以先使用第一協議與待測裝置400建立資料通道(步驟210)。在本實施例中，假設控制模 組110會先使用USB 3.0的協議與待測裝置400建立資料通道。Thereafter, the control module 110 in the hot plug device 100 can first establish a data channel with the device under test 400 using the first protocol (step 210). In this embodiment, assuming a control mode The group 110 will first establish a data channel with the device under test 400 using the protocol of USB 3.0.

在熱插拔裝置100與待測裝置400建立資料通道後，待測裝置400可以透過被建立的資料通道開始傳送第一測試資料到熱插拔裝置100，熱插拔裝置100的接收模組120可以接收待測裝置400所傳送的第一測試資料(步驟220)。在本實施例中，假設待測裝置400中執行有測試軟體，測試軟體會透過作業系統的驅動程式將測試資料傳送給熱插拔裝置100。After the data insertion channel is established between the hot plug device 100 and the device under test 400, the device under test 400 can start transmitting the first test data to the hot plug device 100 through the established data channel, and the receiving module 120 of the hot plug device 100 The first test data transmitted by the device under test 400 can be received (step 220). In this embodiment, assuming that the test software is executed in the device under test 400, the test software transmits the test data to the hot plug device 100 through the driver of the operating system.

若熱插拔裝置100的接收模組120中包含接收緩衝區121，則可以如「第3A圖」之流程所示，接收模組120可以將所接收到的第一測試資料儲存到接收緩衝區121(步驟310)。If the receiving module 120 of the hot plug device 100 includes the receiving buffer 121, the receiving module 120 can store the received first test data into the receiving buffer as shown in the flow of FIG. 3A. 121 (step 310).

在接收模組120將第一測試資料儲存到接收緩衝區121(步驟310)後，若熱插拔裝置100中包含錯誤偵測模組150，則且錯誤偵測功能也被啟用，也就是待測主機400在傳送第一測試資料時，有在第一測試資料中加入錯誤位元，則錯誤偵測模組150可以依據第一測試資料中所包含的錯誤位元判斷待測主機傳送資料的正確性(步驟330)。After the receiving module 120 stores the first test data in the receiving buffer 121 (step 310), if the hot plug device 100 includes the error detecting module 150, the error detecting function is also enabled, that is, When the test host 400 transmits the first test data, the error bit module is added to the first test data, and the error detection module 150 can determine the data transmitted by the host to be tested according to the error bit included in the first test data. Correctness (step 330).

同樣接收模組120將第一測試資料儲存到接收緩衝區121(步驟310)後，若熱插拔裝置100中也包含位元計算模組160，則位元計算模組160可以依據接收緩衝區121儲存完整之第一測試資料的接收時間與第一測試資料的資料長度計算待測主機400的資料傳送速率(步驟350)，也就是計算第一測試資料之接收時間除以第一測試資料之資料長度，計算所得的商數即為與熱插拔裝置100連接之連接介面402的資料傳送速率。Similarly, after the receiving module 120 stores the first test data in the receiving buffer 121 (step 310), if the hot plug device 100 also includes the bit calculating module 160, the bit calculating module 160 can be based on the receiving buffer. 121 storing the complete first test data receiving time and the first test data length calculating the data transfer rate of the host 400 to be tested (step 350), that is, calculating the receiving time of the first test data divided by the first test data The data length, the calculated quotient is the data transfer rate of the connection interface 402 connected to the hot plug device 100.

在實務上，錯誤偵測模組150依據第一測試資料中所包含的錯誤位元判斷待測主機傳送資料的正確性(步驟330)與位元計算模組160依據第一測試資料於接收緩衝區121中的接收時間與第一次測資料的資料長度計算待測主機400的資料傳送速率(步驟350)並沒有先後次序的關係。In practice, the error detection module 150 determines the correctness of the data transmitted by the host to be tested according to the error bit included in the first test data (step 330) and the bit calculation module 160 according to the first test data in the receive buffer. The reception time in the area 121 and the data length of the first measurement data are calculated in the data transfer rate of the host 400 to be tested (step 350).

繼續回到「第2圖」，在待測主機400完成第一測試資料的傳送，且接收模組120完整的接收到被待測主機400所傳送的第一測試資料後，熱插拔裝置100的傳送模組130可以將接收模組120所接收到的第一測試資料傳回待測主機400(步驟230)。Continuing back to the "Fig. 2", after the host 400 to be tested completes the transmission of the first test data, and the receiving module 120 completely receives the first test data transmitted by the host 400 to be tested, the hot plug device 100 The transmitting module 130 can transmit the first test data received by the receiving module 120 to the host 400 to be tested (step 230).

若熱插拔裝置100的傳送模組130中包含傳送緩衝區131，則可以如「第3B圖」之流程所示，熱插拔裝置100的控制模組110可以將接收緩衝區121中所儲存的第一測試資料複製到傳送緩衝區131(步驟370)，使得傳送模組130可以由傳送緩衝區131中讀出第一測試資料，並將所讀出的第一測試資料傳送到待測主機400。If the transfer module 131 is included in the transfer module 130 of the hot plug device 100, the control module 110 of the hot plug device 100 can store the receive buffer 121 as shown in the flow of FIG. 3B. The first test data is copied to the transfer buffer 131 (step 370), so that the transfer module 130 can read the first test data from the transfer buffer 131 and transfer the read first test data to the host to be tested. 400.

若熱插拔裝置100中包含位元計算模組160，則位元計算模組160可以依據傳送模組130將儲存於傳送緩衝區131中之第一測試資料完整傳送到待測主機400的傳送時間與第一測試資料的資料長度計算待測主機400的資料接收速率(步驟390)，也就是計算第一測試資料之傳送時間除以第一測試資料之資料長度，計算所得的商即為與熱插拔裝置100連接之連接介面402的資料接收速率。If the hot-swap device 100 includes the bit calculation module 160, the bit calculation module 160 can completely transmit the first test data stored in the transfer buffer 131 to the host 400 to be tested according to the transfer module 130. The time and the data length of the first test data are used to calculate the data receiving rate of the host 400 to be tested (step 390), that is, the transmission time of the first test data is calculated by dividing the data length of the first test data, and the calculated quotient is The data receiving rate of the connection interface 402 to which the hot plug device 100 is connected.

繼續回到「第2圖」，在熱插拔裝置100的傳送模組130將第一測試資料傳回待測主機400(步驟230)後，熱插拔裝置100的控制模組110可以透過傳送模組130將退出訊號傳送到待測主機400(步驟240)，使得待測主機400執行熱插拔裝置100退出的處理程序。Continuing back to FIG. 2, after the first test data is transmitted back to the host 400 to be tested by the transfer module 130 of the hot plug device 100 (step 230), the control module 110 of the hot plug device 100 can transmit the data. The module 130 transmits the exit signal to the host 400 to be tested (step 240), so that the host 400 to be tested performs the processing procedure of the hot plug device 100 exiting.

在熱插拔裝置100的控制模組110將退出訊號傳送到待測主機400(步驟240)後，控制模組110可以重新啟動熱插拔裝置100(步驟250)，藉以模擬熱插拔裝置100與待測裝置400分離又重新連接的行為。After the control module 110 of the hot plug device 100 transmits the exit signal to the host 400 to be tested (step 240), the control module 110 can restart the hot plug device 100 (step 250), thereby simulating the hot plug device 100. The act of separating and reconnecting with the device under test 400.

在控制模組110重新啟動熱插拔裝置100(步驟250)後，熱插拔裝置100的控制模組110可以判斷是否需要改變與待測裝置400建立資料通道的協議，若否，則控制模組110會繼續使用第一協議與待測裝置400建立資料通道，若是，則控制模組110會使用與第一協議不同的第二協議與待測裝置400建立資料通道(步驟260)。在本實施例中，假設控制模組110會使用USB 2.0的協議與待測裝置400建立資料通道。After the control module 110 restarts the hot plug device 100 (step 250), the control module 110 of the hot plug device 100 can determine whether it is necessary to change the protocol for establishing a data channel with the device under test 400, and if not, the control module The group 110 will continue to establish a data channel with the device under test 400 using the first protocol, and if so, the control module 110 will establish a data channel with the device under test 400 using a second protocol different from the first protocol (step 260). In this embodiment, it is assumed that the control module 110 establishes a data channel with the device under test 400 using the protocol of USB 2.0.

在熱插拔裝置100與待測裝置400建立資料通道後，待測裝置400可以透過被建立的資料通道開始傳送第二測試資料到熱插拔裝置100，熱插拔裝置100的接收模組120可以接收待測裝置400所傳送的第二測試資料(步驟270)。After the data insertion channel is established between the hot plug device 100 and the device under test 400, the device under test 400 can start transmitting the second test data to the hot plug device 100 through the established data channel, and the receiving module 120 of the hot plug device 100 The second test data transmitted by the device under test 400 can be received (step 270).

在待測主機400完成第二測試資料的傳送，且接收模組120 完整的接收到被待測主機400所傳送的第二測試資料後，熱插拔裝置100的傳送模組130可以將接收模組120所接收到的第二測試資料傳回待測主機400(步驟280)。The host 400 to be tested completes the transmission of the second test data, and the receiving module 120 After receiving the second test data transmitted by the host 400 to be tested, the transmitting module 130 of the hot plugging device 100 can transmit the second test data received by the receiving module 120 to the host 400 to be tested. 280).

與接收/傳輸第一測試資料相同的，若熱插拔裝置100的接收模組120中包含接收緩衝區121，則如「第3A圖」之流程所示，接收模組120可以將所接收到的第二測試資料儲存到接收緩衝區121(步驟310)。若熱插拔裝置100中包含錯誤偵測模組150，則且錯誤偵測功能也被啟用，則錯誤偵測模組150可以依據第二測試資料中所包含的錯誤位元判斷待測主機傳送資料的正確性(步驟330)。或是熱插拔裝置100中包含位元計算模組160，則位元計算模組160可以依據第二測試資料被完整儲存於接收緩衝區121中的接收時間與第二測試資料的資料長度計算待測主機400的資料傳送速率(步驟350)。Similarly to receiving/transmitting the first test data, if the receiving module 120 of the hot plug device 100 includes the receive buffer 121, as shown in the flow of "FIG. 3A", the receiving module 120 can receive the received buffer 120. The second test data is stored in the receive buffer 121 (step 310). If the error detection module 150 is included in the hot plug device 100, and the error detection function is also enabled, the error detection module 150 can determine the host to be tested according to the error bit included in the second test data. The correctness of the data (step 330). Or the bit interpolation module 160 is included in the hot plug device 100, and the bit calculation module 160 can calculate the receiving time of the second test data stored in the receiving buffer 121 and the data length of the second test data. The data transfer rate of the host 400 to be tested (step 350).

而若熱插拔裝置100的傳送模組130中包含傳送緩衝區131，則如「第3B圖」之流程所示，熱插拔裝置100的控制模組110可以將接收緩衝區121中所儲存的第二測試資料複製到傳送緩衝區131(步驟370)，使得傳送模組130可以由傳送緩衝區131中讀出第二測試資料，並將所讀出的第二測試資料傳送到待測主機400。If the transfer module 131 is included in the transfer module 130 of the hot plug device 100, the control module 110 of the hot plug device 100 can store the receive buffer 121 as shown in the flow of FIG. 3B. The second test data is copied to the transfer buffer 131 (step 370), so that the transfer module 130 can read the second test data from the transfer buffer 131 and transfer the read second test data to the host to be tested. 400.

若熱插拔裝置100中包含位元計算模組160，則位元計算模組160可以依據第二測試資料完整的由傳送緩衝區131被傳送到待測裝置400的傳送時間與第二測試資料的資料長度計算待測主機400的資料接收速率(步驟390)，也就是計算與熱插拔裝置100連接之連接介面402的資料接收速率。If the hot-swap device 100 includes the bit calculation module 160, the bit calculation module 160 can complete the transfer time and the second test data transmitted from the transfer buffer 131 to the device under test 400 according to the second test data. The data length calculates the data reception rate of the host 400 to be tested (step 390), that is, calculates the data reception rate of the connection interface 402 connected to the hot plug device 100.

如此，透過本發明，熱插拔裝置100可以自動對待測主機400之連接介面402進行測試熱插拔測試、傳輸壓力測試、傳輸錯誤率測試、以及傳輸流量測試等測試，藉以對待測主機400的連接介面402進行完整的測試。Therefore, through the present invention, the hot plug device 100 can automatically perform the test hot plug test, the transmission stress test, the transmission error rate test, and the transmission flow test for the connection interface 402 of the host 400 to be tested, so as to test the host 400. Connect interface 402 for a complete test.

綜上所述，可知本發明與先前技術之間的差異在於具有熱插拔裝置在使用第一協議與待測主機建立資料通道後，接收待測主機所傳送的測試資料，並依據所傳送的測試資料對待測主機的連接介面進行測試， 並在完成測試後，重新啟動熱插拔裝置，藉以讓熱插拔裝置繼續使用第二協議與待測主機建立資料通道，並依據待測主機再次傳送之測試資料對待測主機的連接介面進行測試之技術手段，藉由此一技術手段可以解決先前技術所存在無法對連接介面進行完整且有效率之測試的問題，進而達成自動對待測主機之連接介面進行完整測試的技術功效。In summary, it can be seen that the difference between the present invention and the prior art is that the hot plug device receives the test data transmitted by the host to be tested after establishing the data channel with the host to be tested using the first protocol, and according to the transmitted The test data is tested on the connection interface of the test host. After the test is completed, the hot plug device is restarted, so that the hot plug device continues to use the second protocol to establish a data channel with the host to be tested, and tests the connection interface of the host to be tested according to the test data transmitted by the host to be tested again. The technical means can solve the problem that the prior art cannot perform complete and efficient testing of the connection interface by using a technical means, thereby achieving the technical effect of completely testing the connection interface of the automatic test host.

再者，本發明之自動切換協議以建立並測試資料通道之方法，可實現於硬體、軟體或硬體與軟體之組合中，亦可在電腦系統中以集中方式實現或以不同元件散佈於若干互連之電腦系統的分散方式實現。Furthermore, the automatic switching protocol of the present invention can be implemented in hardware, software or a combination of hardware and software in a method of establishing and testing a data channel, or can be implemented in a centralized manner in a computer system or distributed in different components. The decentralized implementation of several interconnected computer systems.

雖然本發明所揭露之實施方式如上，惟所述之內容並非用以直接限定本發明之專利保護範圍。任何本發明所屬技術領域中具有通常知識者，在不脫離本發明所揭露之精神和範圍的前提下，對本發明之實施的形式上及細節上作些許之更動潤飾，均屬於本發明之專利保護範圍。本發明之專利保護範圍，仍須以所附之申請專利範圍所界定者為準。While the embodiments of the present invention have been described above, the above description is not intended to limit the scope of the invention. Any modification of the form and details of the practice of the present invention, which is a matter of ordinary skill in the art to which the present invention pertains, is a patent protection of the present invention. range. The scope of the invention is to be determined by the scope of the appended claims.

步驟210‧‧‧熱插拔裝置使用第一協議與待測主機建立資料通道Step 210‧‧‧The hot-swappable device establishes a data channel with the host to be tested using the first protocol

步驟220‧‧‧熱插拔裝置接收待測主機所傳送之第一測試資料，第一測試資料之資料長度可使待測主機以第一協議定義之最大傳輸速度傳送第一測試資料達到第一預定時間Step 220‧‧ The hot plugging device receives the first test data transmitted by the host to be tested, and the data length of the first test data enables the host to be tested to transmit the first test data to the first at the maximum transmission speed defined by the first protocol. scheduled time

步驟230‧‧‧熱插拔裝置傳送所接收到之第一測試資料至待測主機Step 230‧‧‧The hot plug device transmits the received first test data to the host to be tested

步驟240‧‧‧熱插拔裝置傳送退出訊息至待測主機Step 240‧‧‧The hot plug device sends an exit message to the host to be tested

步驟250‧‧‧熱插拔裝置重新啟動，藉以模擬熱插拔之行為Step 250‧‧‧The hot-swap device is restarted to simulate hot-swap behavior

步驟260‧‧‧熱插拔裝置使用第二協議與待測主機建立資料通道Step 260‧‧‧The hot plug device uses the second protocol to establish a data channel with the host to be tested

步驟270‧‧‧熱插拔裝置接收待測主機所傳送之第二測試資料，第二測試資料之資料長度可使待測主機以第二協議定義之最大傳輸速度傳送第二測試資料達到第二預定時間Step 270‧‧ The hot plug device receives the second test data transmitted by the host to be tested, and the data length of the second test data enables the host to be tested to transmit the second test data to the second at the maximum transmission speed defined by the second protocol. scheduled time

步驟280‧‧‧熱插拔裝置傳送所接收到之第二測試資料至待測主機Step 280‧‧ The hot plugging device transmits the received second test data to the host to be tested