TWI790161B - Method for detecting x-ray exposure and x-ray exposure detecting system - Google Patents

A method for detecting x-ray exposure includes following steps of: comparing a first image and a second image stored in a memory of a flat panel sensor to generate a comparison result in a first mode by a processor of the flat panel sensor, which the first image and the second image are obtained by the flat panel sensor; determining whether the comparison result exceeds a preset threshold by the processor in the first mode; switching the first mode into a second mode if the comparison result exceeds the a preset threshold; reading out a third image and a fourth image stored in the memory of the flat panel sensor, which the third image and the fourth image are obtained by irradiating the flat panel sensor with X-ray through the processor in the second mode; and transmitting the third image and the fourth image to an external system by the processor in the second mode.

X射線曝光偵測方法及X射線曝光偵測系統X-ray exposure detection method and X-ray exposure detection system

本案涉及一種感測裝置及方法。詳細而言，本案涉及一種X射線曝光偵測方法及X射線曝光偵測系統。This case relates to a sensing device and method. Specifically, this case involves an X-ray exposure detection method and an X-ray exposure detection system.

現有X射線設備中，通常需要藉由額外的輻射劑量計(dose meter)或是嵌入光感測器來偵測X射線擊發至平板感測器之時間，換言之，需要額外硬體設備來偵測X射線擊發之情況。In existing X-ray equipment, it is usually necessary to use an additional radiation dosimeter (dose meter) or to embed a light sensor to detect the time when the X-ray hits the flat panel sensor. In other words, additional hardware equipment is required to detect The case of X-ray firing.

接著，若X射線設備需要應用於無線通訊領域或防水相關領域，額外硬體設備將造成額外生產成本，並且需要額外設計以防止額外硬體設備進水。Then, if the X-ray equipment needs to be applied in the field of wireless communication or waterproof related fields, additional hardware equipment will cause additional production costs, and additional design is required to prevent the additional hardware equipment from entering water.

因此，上述技術尚存諸多缺陷，而有待本領域從業人員研發出其餘適合的X射線曝光偵測設計。Therefore, the above-mentioned technology still has many defects, and it is waiting for practitioners in the field to develop other suitable X-ray exposure detection designs.

本案的一面向涉及一種X射線曝光偵測方法。X射線曝光偵測方法包含以下步驟：於第一模式下，藉由平板感測器之處理器比對平板感測器之記憶體所儲存的第一影像及第二影像，以產生比對結果，第一影像及第二影像為平板感測器感測所獲得；於第一模式下，藉由處理器判斷比對結果是否超過預設閾值；若比對結果超過預設閾值，藉由處理器切換平板感測器之第一模式至第二模式；於第二模式下，藉由處理器讀取記憶體所儲存的第三影像及第四影像，第三影像及第四影像為平板感測器被X射線照射所獲得；以及於第二模式下，藉由處理器傳輸記憶體所儲存的第三影像及第四影像至外部系統。One aspect of the case relates to a method for detecting X-ray exposure. The X-ray exposure detection method includes the following steps: in the first mode, the processor of the flat panel sensor compares the first image and the second image stored in the memory of the flat panel sensor to generate a comparison result , the first image and the second image are obtained by the flat panel sensor; in the first mode, the processor judges whether the comparison result exceeds the preset threshold; if the comparison result exceeds the preset threshold, the processing The device switches the first mode of the flat panel sensor to the second mode; in the second mode, the third image and the fourth image stored in the memory are read by the processor, and the third image and the fourth image are flat sensor The detector is obtained by X-ray irradiation; and in the second mode, the processor transmits the third image and the fourth image stored in the memory to the external system.

本案的另一面向涉及一種X射線曝光偵測系統，包含平板感測器。平板感測器包含感測陣列、記憶體及處理器。感測陣列用以進行光感測，以獲得第一影像及第二影像。感測陣列用以感測X射線產生器之X射線，以產生第三影像及第四影像。處理器耦接於記憶體及感測陣列，並用以於第一模式下比對第一影像及第二影像，以產生比對結果。處理器用以於第一模式下判斷比對結果是否超過預設閾值，若比對結果超過預設閾值，處理器用以切換平板感測器之第一模式至第二模式，處理器用以於第二模式下讀取感測陣列儲存至記憶體的第三影像及第四影像，處理器用以於第二模式下傳輸記憶體所儲存的第三影像及第四影像至外部系統。Another aspect of the case relates to an X-ray exposure detection system that includes a flat panel sensor. A flat panel sensor includes a sensing array, memory and processor. The sensing array is used for light sensing to obtain the first image and the second image. The sensing array is used for sensing the X-rays of the X-ray generator to generate the third image and the fourth image. The processor is coupled to the memory and the sensor array, and is used for comparing the first image and the second image in the first mode to generate a comparison result. The processor is used to judge whether the comparison result exceeds the preset threshold in the first mode, and if the comparison result exceeds the preset threshold, the processor is used to switch the first mode of the flat panel sensor to the second mode, and the processor is used for the second In the second mode, the third image and the fourth image stored in the memory by the sensing array are read, and the processor is used to transmit the third image and the fourth image stored in the memory to an external system in the second mode.

以下將以圖式及詳細敘述清楚說明本案之精神，任何所屬技術領域中具有通常知識者在瞭解本案之實施例後，當可由本案所教示之技術，加以改變及修飾，其並不脫離本案之精神與範圍。The following will clearly illustrate the spirit of this case with diagrams and detailed descriptions. Anyone with ordinary knowledge in the technical field can change and modify the technology taught in this case after understanding the embodiment of this case. It does not depart from the spirit of this case. Spirit and scope.

本文之用語只為描述特定實施例，而無意為本案之限制。單數形式如“一”、“這”、“此”、“本”以及“該”，如本文所用，同樣也包含複數形式。The terminology used herein is for the purpose of describing particular embodiments only, and is not intended to be limiting of the present case. Singular forms such as "a", "the", "the", "this" and "the", as used herein, also include plural forms.

關於本文中所使用之『包含』、『包括』、『具有』、『含有』等等，均為開放性的用語，即意指包含但不限於。"Includes", "including", "has", "containing" and so on used in this article are all open terms, meaning including but not limited to.

關於本文中所使用之用詞（terms），除有特別註明外，通常具有每個用詞使用在此領域中、在本案之內容中與特殊內容中的平常意義。某些用以描述本案之用詞將於下或在此說明書的別處討論，以提供本領域技術人員在有關本案之描述上額外的引導。Regarding the terms (terms) used in this article, unless otherwise specified, generally have the ordinary meaning of each term used in this field, in the content of this case and in the special content. Certain terms used to describe the subject matter are discussed below or elsewhere in this specification to provide those skilled in the art with additional guidance in describing the subject matter.

第1圖為根據本案一些實施例繪示的X射線曝光偵測系統100之電路方塊示意圖。在一些實施例中，請參閱第1圖，X射線曝光偵測系統100包含平板感測器110及X射線產生器120。FIG. 1 is a schematic circuit block diagram of an X-ray exposure detection system 100 according to some embodiments of the present invention. In some embodiments, please refer to FIG. 1 , the X-ray exposure detection system 100 includes a flat panel sensor 110 and an X-ray generator 120 .

在一些實施例中，X射線曝光偵測系統100可為X光機、移動式X光機、X光數位乳房攝影儀或口腔X光機。須說明的是，X射線曝光偵測系統100之種類不以本案實施例所列舉之例子為限。In some embodiments, the X-ray exposure detection system 100 can be an X-ray machine, a mobile X-ray machine, an X-ray digital mammography machine or an oral X-ray machine. It should be noted that the types of the X-ray exposure detection system 100 are not limited to the examples listed in the embodiment of this case.

在一些實施例中，平板感測器110包含記憶體111、處理器112及感測陣列113。感測陣列113用以進行光感測，以獲得第一影像及第二影像。感測陣列113用以感測X射線產生器120之X射線，以產生第三影像及第四影像。處理器112耦接於記憶體111及感測陣列113，並用以於第一模式下比對第一影像及第二影像，以產生比對結果。處理器112用以於第一模式下判斷比對結果是否超過預設閾值。In some embodiments, the flat panel sensor 110 includes a memory 111 , a processor 112 and a sensing array 113 . The sensing array 113 is used for light sensing to obtain a first image and a second image. The sensing array 113 is used for sensing the X-rays of the X-ray generator 120 to generate a third image and a fourth image. The processor 112 is coupled to the memory 111 and the sensing array 113, and is used for comparing the first image and the second image in the first mode to generate a comparison result. The processor 112 is configured to determine whether the comparison result exceeds a preset threshold in the first mode.

接著，若比對結果超過預設閾值，處理器112用以切換平板感測器110之第一模式至第二模式，處理器112用以於第二模式下讀取感測陣列113儲存至記憶體111的第三影像及第四影像，處理器112用以於第二模式下傳輸記憶體111所儲存的第三影像及第四影像至外部系統900。Next, if the comparison result exceeds the preset threshold, the processor 112 is used to switch the first mode of the flat panel sensor 110 to the second mode, and the processor 112 is used to read the sensing array 113 and store it in the memory in the second mode. The third image and the fourth image of the volume 111, the processor 112 is used to transmit the third image and the fourth image stored in the memory 111 to the external system 900 in the second mode.

在一些實施例中，請參閱第1圖，感測陣列113包含複數個感測畫素(圖中未示)。複數個感測畫素(圖中未示)分別設置於感測陣列113之複數感測畫素行及複數畫素感測列上。In some embodiments, referring to FIG. 1 , the sensing array 113 includes a plurality of sensing pixels (not shown in the figure). A plurality of sensing pixels (not shown in the figure) are respectively disposed on the plurality of sensing pixel rows and the plurality of pixel sensing columns of the sensing array 113 .

在一些實施例中，外部系統900可為電腦、平板電腦或伺服器。外部系統900用以讀取X射線曝光偵測系統100所拍攝之影像，藉以進行分析或供醫事人員參考。In some embodiments, the external system 900 can be a computer, a tablet computer or a server. The external system 900 is used to read the images captured by the X-ray exposure detection system 100 for analysis or reference by medical personnel.

在一些實施例中，目標物O可為人體之骨骼組職、硬組職或病變之軟組職。舉例而言，目標物O可為胸腔之肋骨、口腔之牙齒或乳癌之乳腺組織。須說明的是，目標物O不以本案實施例所列舉之例子為限。In some embodiments, the target object O can be skeletal tissue, hard tissue or soft tissue of a disease. For example, the object O can be ribs in the chest cavity, teeth in the oral cavity, or breast tissue in breast cancer. It should be noted that the object O is not limited to the examples listed in the embodiment of this case.

第2圖為根據本案一些實施例繪示的X射線曝光偵測方法200之步驟流程示意圖。在一些實施例中，X射線曝光偵測方法200可由第1圖之X射線曝光偵測系統100所執行。FIG. 2 is a schematic flowchart of steps of an X-ray exposure detection method 200 according to some embodiments of the present application. In some embodiments, the X-ray exposure detection method 200 can be implemented by the X-ray exposure detection system 100 in FIG. 1 .

於步驟210中，平板感測器進入第一模式，以讀取平板感測器之記憶體之第一影像及第二影像。In step 210, the flat panel sensor enters a first mode to read the first image and the second image from the memory of the flat panel sensor.

在一些實施例中，請參閱第1圖及第2圖，X射線曝光偵測系統100之平板感測器110進入第一模式，以藉由X射線曝光偵測系統100之處理器112讀取平板感測器110之記憶體111之第一影像及第二影像。須說明的是，第一影像及第二影像為平板感測器110之感測陣列113進行光感測，所擷取之影像。詳細而言，平板感測器110之影像可為逐行讀取平板感測器110之感測陣列113之影像、逐列讀取平板感測器110之感測陣列113之影像、或將平板感測器110之感測陣列113劃份為複數個感興趣區域，並分別讀取複數個感興趣區域之影像。In some embodiments, please refer to FIG. 1 and FIG. 2 , the flat panel sensor 110 of the X-ray exposure detection system 100 enters a first mode to be read by the processor 112 of the X-ray exposure detection system 100 The first image and the second image of the memory 111 of the flat panel sensor 110 . It should be noted that the first image and the second image are images captured by the sensing array 113 of the flat panel sensor 110 through light sensing. In detail, the image of the flat panel sensor 110 can be read row by row the image of the sensing array 113 of the flat panel sensor 110, read the image of the sensing array 113 of the flat panel sensor 110 column by column, or The sensing array 113 of the sensor 110 is divided into a plurality of regions of interest, and images of the plurality of regions of interest are respectively read.

於步驟220中，判斷第一影像及第二影像之感興趣區域之灰階值是否超過預設閾值。In step 220, it is determined whether the grayscale values of the regions of interest in the first image and the second image exceed a preset threshold.

在一些實施例中，請參閱第1圖及第2圖，藉由平板感測器110判斷第一影像及第二影像之感興趣區域之灰階值是否超過預設閾值，藉以產生比對結果。In some embodiments, please refer to FIG. 1 and FIG. 2 , by using the flat panel sensor 110 to determine whether the grayscale value of the region of interest in the first image and the second image exceeds a preset threshold, so as to generate a comparison result .

若比對結果為第一影像及第二影像之感興趣區域之灰階值不超過預設閾值，則藉由平板感測器110之處理器112執行步驟210。若比對結果為第一影像及第二影像之感興趣區域之灰階值超過預設閾值，則藉由平板感測器110之處理器112執行步驟230。If the result of the comparison is that the grayscale values of the ROIs of the first image and the second image do not exceed the preset threshold, the processor 112 of the flat panel sensor 110 executes step 210 . If the result of the comparison is that the grayscale values of the ROIs of the first image and the second image exceed the preset threshold, the processor 112 of the flat panel sensor 110 executes step 230 .

在一些實施例中，第一模式為滾動模式(Rolling mode)。於第一模式下，藉由平板感測器110之處理器112持續讀取記憶體111之第一影像及第二影像，並判斷第一影像及第二影像之感興趣區域之灰階值是否超過預設閾值。In some embodiments, the first mode is a rolling mode. In the first mode, the processor 112 of the flat panel sensor 110 continuously reads the first image and the second image of the memory 111, and determines whether the gray scale value of the region of interest of the first image and the second image is exceeded the preset threshold.

須說明的是，於第一模式下，藉由平板感測器110之處理器112持續讀取記憶體111之第一影像及第二影像，可以持續清空平板感測器110之感測陣列113之複數個感測畫素所累績電荷，藉以減少影像傳輸延遲的情況。It should be noted that in the first mode, the processor 112 of the flat panel sensor 110 continuously reads the first image and the second image of the memory 111, so that the sensing array 113 of the flat panel sensor 110 can be continuously cleared The charges accumulated by the plurality of sensing pixels can reduce the image transmission delay.

於步驟230中，平板感測器進入第二模式，以讀取平板感測器之記憶體之第三影像及第四影像。In step 230, the panel sensor enters the second mode to read the third image and the fourth image from the memory of the panel sensor.

在一些實施例中，請參閱第1圖及第2圖，若比對結果為第一影像及第二影像之感興趣區域之灰階值超過預設閾值，則藉由平板感測器110之處理器112將平板感測器110之第一模式切換為第二模式，藉以讀取第二模式下之平板感測器110之記憶體111之第三影像及第四影像。In some embodiments, please refer to FIG. 1 and FIG. 2 , if the result of the comparison is that the gray scale value of the region of interest in the first image and the second image exceeds a preset threshold, the flat panel sensor 110 The processor 112 switches the first mode of the flat panel sensor 110 to the second mode, so as to read the third image and the fourth image of the memory 111 of the flat panel sensor 110 in the second mode.

於步驟240中，判斷第三影像及第四影像之感興趣區域之灰階值是否超過預設閾值。In step 240, it is judged whether the gray scale value of the ROI of the third image and the fourth image exceeds a preset threshold.

在一些實施例中，請參閱第1圖及第2圖，接著，若藉由平板感測器110之處理器112讀取出來的第三影像及第四影像之感興趣區域之灰階值依舊超過預設閾值，則藉由平板感測器110之處理器112執行步驟240。若藉由平板感測器110之處理器112讀取出來的第三影像及第四影像之感興趣區域之灰階值不超過預設閾值，則藉由平板感測器110之處理器112執行步驟210，藉以將第二模式切換回第一模式。In some embodiments, please refer to FIG. 1 and FIG. 2 , then, if the gray scale value of the region of interest in the third image and the fourth image read by the processor 112 of the flat panel sensor 110 remains the same If the predetermined threshold is exceeded, step 240 is executed by the processor 112 of the panel sensor 110 . If the gray scale value of the region of interest of the third image and the fourth image read by the processor 112 of the flat panel sensor 110 does not exceed the preset threshold, the processor 112 of the flat panel sensor 110 executes the Step 210, so as to switch the second mode back to the first mode.

於步驟250中，傳輸記憶體所儲存第三影像及第四影像至外部系統。In step 250, the third image and the fourth image stored in the memory are transmitted to an external system.

在一些實施例中，請參閱第1圖及第2圖，若藉由平板感測器110之處理器112讀取出來的第三影像及第四影像之感興趣區域之灰階值超過預設閾值，藉由平板感測器110之處理器112傳輸記憶體111之第三影像及第四影像傳輸至外部系統900。In some embodiments, please refer to FIG. 1 and FIG. 2, if the grayscale value of the region of interest in the third image and the fourth image read by the processor 112 of the flat panel sensor 110 exceeds the preset For the threshold value, the processor 112 of the flat panel sensor 110 transmits the third image and the fourth image of the memory 111 to the external system 900 .

須說明的是，上述第三影像及第四影像為平板感測器110之感測陣列113被照射X射線之影像。It should be noted that the above-mentioned third image and fourth image are images of the sensing array 113 of the flat panel sensor 110 being irradiated with X-rays.

接著，第二模式為正常模式(Normal mode)。於第二模式下，藉由平板感測器110之處理器112用以持續讀取記憶體111之第三影像及第四影像，並判斷第三影像及第四影像之感興趣區域之灰階值是否超過預設閾值。若第三影像及第四影像之感興趣區域之灰階值超過預設閾值，藉由平板感測器110之處理器112傳輸記憶體111之第三影像及第四影像傳輸至外部系統900。Next, the second mode is a normal mode (Normal mode). In the second mode, the processor 112 of the flat panel sensor 110 is used to continuously read the third image and the fourth image of the memory 111, and determine the gray scale of the region of interest of the third image and the fourth image Whether the value exceeds a preset threshold. If the gray scale value of the region of interest in the third image and the fourth image exceeds the preset threshold, the processor 112 of the flat panel sensor 110 transmits the third image and the fourth image from the memory 111 to the external system 900 .

須說明的是，第一模式與第二模式之差異在於是否傳輸影像至外部系統。進一步說明的是，第二模式僅為平板感測器110之感測陣列113照射X射線下發生。It should be noted that the difference between the first mode and the second mode lies in whether to transmit images to an external system. It is further explained that the second mode only occurs when the sensing array 113 of the flat panel sensor 110 is irradiated with X-rays.

第3圖為根據本案一些實施例繪示的X射線曝光偵測方法之實際運作流程之訊號波形示意圖。FIG. 3 is a schematic diagram of the signal waveform of the actual operation process of the X-ray exposure detection method according to some embodiments of the present invention.

在一些實施例中，請參閱第1圖及第3圖，XRAY為X射線產生器120所產生的X射線訊號。Readout為平板感測器110之處理器112讀取感測陣列113儲存至記憶體111之影像的讀取訊號。Reset為平板感測器110之處理器112對感測陣列113進行重置之重置訊號。In some embodiments, please refer to FIG. 1 and FIG. 3 , XRAY is the X-ray signal generated by the X-ray generator 120 . Readout is a read signal for the processor 112 of the flat panel sensor 110 to read the image stored in the memory 111 by the sensing array 113 . Reset is a reset signal for the processor 112 of the flat panel sensor 110 to reset the sensing array 113 .

接著，ROI為平板感測器110之處理器112判斷影像之感興趣區域之灰階值是否超過預設閾值H之比對結果訊號。Transfer為平板感測器110之處理器112根據比對結果訊號ROI傳輸影像至外部系統900之控制訊號。Next, the ROI is a comparison result signal for the processor 112 of the flat panel sensor 110 to determine whether the gray scale value of the ROI of the image exceeds the preset threshold H. Transfer is a control signal for the processor 112 of the flat panel sensor 110 to transmit the image to the external system 900 according to the comparison result signal ROI.

在一些實施例中，請參閱第1圖至第3圖，於第一階段I1中，X射線產生器120並未產生X射線訊號，平板感測器110處於第一模式中。平板感測器110之處理器112執行步驟210及步驟220，以持續讀取感測陣列113儲存至記憶體111之影像(例如：影像Frame M)，藉以比對影像之感興趣區域之灰階值是否超過預設閥值H。平板感測器110之處理器112於時間點P1判定影像Frame M之感興趣區域之灰階值未超過預設閥值H，因此，平板感測器110持續維持第一模式。In some embodiments, please refer to FIG. 1 to FIG. 3 , in the first stage I1, the X-ray generator 120 does not generate the X-ray signal, and the flat panel sensor 110 is in the first mode. The processor 112 of the flat panel sensor 110 executes step 210 and step 220 to continuously read the image (for example: image Frame M) stored in the memory 111 by the sensor array 113, so as to compare the gray scale of the region of interest in the image Whether the value exceeds the preset threshold H. The processor 112 of the flat panel sensor 110 determines at the time point P1 that the grayscale value of the ROI of the image Frame M does not exceed the preset threshold H, therefore, the flat panel sensor 110 continues to maintain the first mode.

在一些實施例中，請參閱第1圖至第3圖，於第二階段I2之第一子階段I12中，X射線產生器120產生X射線訊號，平板感測器110處於第一模式中。平板感測器110之處理器112執行步驟210及步驟220，平板感測器110之感測陣列113因照射X射線，影像之感興趣區域之灰階值超過預設閥值H。平板感測器110之處理器112於時間點P2判定影像之感興趣區域之灰階值超過預設閥值H，因此，平板感測器110之處理器112執行步驟230將切換平板感測器110之第一模式至第二模式。In some embodiments, please refer to FIG. 1 to FIG. 3 , in the first sub-phase I12 of the second phase I2 , the X-ray generator 120 generates X-ray signals, and the flat panel sensor 110 is in the first mode. The processor 112 of the flat panel sensor 110 executes step 210 and step 220 , and the grayscale value of the region of interest in the image exceeds the preset threshold H due to the X-ray irradiation by the sensing array 113 of the flat panel sensor 110 . The processor 112 of the flat panel sensor 110 determines at time point P2 that the grayscale value of the region of interest of the image exceeds the preset threshold H, therefore, the processor 112 of the flat panel sensor 110 executes step 230 to switch the flat panel sensor 110 of the first mode to the second mode.

於此同時，處理器112將平板感測器110自第一模式切換第二模式之前，處理器112更用以產生重置訊號Reset，以重置平板感測器110之感測陣列113，以藉由處理器112於第二模式下讀取感測陣列113儲存至記憶體111之影像。At the same time, before the processor 112 switches the panel sensor 110 from the first mode to the second mode, the processor 112 is further used to generate a reset signal Reset to reset the sensing array 113 of the panel sensor 110 to The image stored in the memory 111 by the sensing array 113 is read by the processor 112 in the second mode.

須說明的是，重置平板感測器110之感測陣列113之方式可為逐行重置方式、逐列重置方式或分區重置方式，並不以本案實施例為限。第一子階段I12相同於第一模式切換至第二模式之緩衝階段。It should be noted that, the method of resetting the sensing array 113 of the flat panel sensor 110 may be a row-by-row reset method, a column-by-column reset method or a partition reset method, and is not limited to this embodiment. The first sub-stage I12 is the same as the buffering stage for switching from the first mode to the second mode.

在一些實施例中，請參閱第1圖至第3圖，於第二階段I2之第二子階段I22中，X射線產生器120持續照射X射線訊號，平板感測器110處於第二模式中。平板感測器110之處理器112執行步驟240。In some embodiments, please refer to FIG. 1 to FIG. 3 , in the second sub-phase I22 of the second phase I2, the X-ray generator 120 continuously emits X-ray signals, and the flat panel sensor 110 is in the second mode. . The processor 112 of the flat panel sensor 110 executes step 240 .

接者，平板感測器110之處理器112於時間點P3判定影像Frame N之感興趣區域之灰階值超過預設閥值H，因此，處理器112將於時間點P4傳輸影像Frame N至外部系統900。Next, the processor 112 of the flat panel sensor 110 determines at time point P3 that the grayscale value of the ROI of the image Frame N exceeds the preset threshold H, so the processor 112 will transmit the image Frame N to External system 900.

再者，平板感測器110之處理器112用以於時間點P4比對影像Frame N及影像Frame N+1，以判斷影像Frame N+1之感興趣區域之灰階值是否超過預設閥值H，藉以產生比對結果。比對結果為影像Frame N+1之感興趣區域之灰階值超過預設閥值H，因此，處理器112將於時間點P5傳輸影像Frame N+1至外部系統900。Furthermore, the processor 112 of the flat panel sensor 110 is used to compare the image Frame N and the image Frame N+1 at the time point P4 to determine whether the grayscale value of the ROI of the image Frame N+1 exceeds the preset threshold. The value H is used to generate the comparison result. The result of the comparison is that the grayscale value of the ROI of the image Frame N+1 exceeds the preset threshold H, therefore, the processor 112 will transmit the image Frame N+1 to the external system 900 at time point P5.

緊接者，平板感測器110之處理器112用以於時間點P5比對影像Frame N+1及影像Frame N+2，以判斷影像Frame N+2之感興趣區域之灰階值是否超過預設閥值H，藉以產生比對結果。比對結果為影像Frame N+2之感興趣區域之灰階值超過預設閥值H，因此，處理器112將於時間點P6傳輸影像Frame N+2至外部系統900。Next, the processor 112 of the flat panel sensor 110 is used to compare the image Frame N+1 and the image Frame N+2 at the time point P5 to determine whether the grayscale value of the region of interest in the image Frame N+2 exceeds The preset threshold H is used to generate the comparison result. The result of the comparison is that the grayscale value of the ROI of the image Frame N+2 exceeds the preset threshold H, therefore, the processor 112 will transmit the image Frame N+2 to the external system 900 at time point P6.

接者，平板感測器110之處理器112用以於時間點P6比對影像Frame N+2及影像Frame N+3，以判斷影像Frame N+3之感興趣區域之灰階值是否超過預設閥值H，藉以產生比對結果。比對結果為影像Frame N+3之感興趣區域之灰階值超過預設閥值H，因此，處理器112將於時間點P7傳輸影像Frame N+3至外部系統900。Next, the processor 112 of the flat panel sensor 110 is used to compare the image Frame N+2 and the image Frame N+3 at the time point P6 to determine whether the grayscale value of the region of interest in the image Frame N+3 exceeds the preset A threshold H is set to generate a comparison result. The result of the comparison is that the grayscale value of the ROI of the image Frame N+3 exceeds the preset threshold H, therefore, the processor 112 will transmit the image Frame N+3 to the external system 900 at time point P7.

再者，平板感測器110之處理器112用以於時間點P7比對影像Frame N+3及影像Frame N+4，以判斷影像Frame N+4之感興趣區域之灰階值是否超過預設閥值H，藉以產生比對結果。比對結果為影像Frame N+4之感興趣區域之灰階值未超過預設閥值H，因此，處理器112將從第二模式切換第一模式，並於時間點P8不傳輸影像Frame N+4至外部系統900。第二子階段I22相同於第二模式之處理階段。Furthermore, the processor 112 of the flat panel sensor 110 is used to compare the image Frame N+3 and the image Frame N+4 at the time point P7 to determine whether the grayscale value of the region of interest in the image Frame N+4 exceeds the preset value. A threshold H is set to generate a comparison result. The result of the comparison is that the gray scale value of the ROI of the image Frame N+4 does not exceed the preset threshold H, therefore, the processor 112 will switch from the second mode to the first mode, and will not transmit the image Frame N at time point P8 +4 to external systems 900. The second sub-stage I22 is the same as the processing stage of the second mode.

在一些實施例中，請參閱第1圖至第3圖，於第三階段I3中，X射線產生器120結束產生X射線訊號，平板感測器110處於第一模式中。平板感測器110之處理器112執行步驟210及步驟220。詳細步驟已於前述段落說明，於此不作贅述。In some embodiments, please refer to FIG. 1 to FIG. 3 , in the third stage I3 , the X-ray generator 120 stops generating X-ray signals, and the flat panel sensor 110 is in the first mode. The processor 112 of the flat panel sensor 110 performs step 210 and step 220 . The detailed steps have been described in the preceding paragraphs, and will not be repeated here.

第4A圖至第4F圖為根據本案一些實施例繪示的X射線曝光偵測方法之感興趣區域示意圖。在一些實施例中，請參閱第4A圖至第4F圖，複數圖式中的網點圖形即為比對影像與影像間之感興趣區域。須說明的是，感興趣區域之形狀可依據實際需求設計，並不以本案圖式實施例為限。FIG. 4A to FIG. 4F are schematic diagrams of regions of interest of the X-ray exposure detection method according to some embodiments of the present invention. In some embodiments, please refer to FIG. 4A to FIG. 4F , the dot patterns in the plural patterns are the regions of interest between the comparison images and the images. It should be noted that the shape of the region of interest can be designed according to actual needs, and is not limited to the embodiment of the drawing.

進一步說明的是，感興趣區域之設定之時間點應為第3圖之第一階段I1之前。It is further explained that the time point for setting the ROI should be before the first stage I1 in FIG. 3 .

第5A圖為根據本案一些實施例繪示的X射線曝光偵測方法之第一模式之訊號時序示意圖。在一些實施例中，請參閱第3圖及第5A圖，第5A圖之訊號時序圖對應於第3圖中第一階段I1。須說明的是，於第一模式下，第1圖之X射線曝光偵測系統100之平板感測器110之處理器112將依序讀取記憶體111中所儲存之影像Frame M至影像Frame M+4。處理器112將依序比對時序相鄰的兩個影像之相同的感興趣區域之灰階值是否超過預設閾值H(例如：比對影像Frame M及影像Frame M+1, 比對影像Frame M+1及影像Frame M+2)。FIG. 5A is a schematic diagram of signal timing in the first mode of the X-ray exposure detection method according to some embodiments of the present invention. In some embodiments, please refer to FIG. 3 and FIG. 5A , the signal timing diagram in FIG. 5A corresponds to the first stage I1 in FIG. 3 . It should be noted that in the first mode, the processor 112 of the flat panel sensor 110 of the X-ray exposure detection system 100 in FIG. 1 will sequentially read the image Frame M to the image Frame stored in the memory 111 M+4. The processor 112 will sequentially compare whether the gray scale value of the same region of interest of two temporally adjacent images exceeds the preset threshold H (for example: comparing image Frame M and image Frame M+1, comparing image Frame M+1 and Image Frame M+2).

接著，由於第1圖之X射線曝光偵測系統100之感測陣列113並未照射X射線，影像Frame M至影像Frame M+4均不會傳輸至外部系統900。Then, since the sensing array 113 of the X-ray exposure detection system 100 in FIG. 1 is not irradiated with X-rays, the images Frame M to Frame M+4 are not transmitted to the external system 900 .

第5B圖為根據本案一些實施例繪示的X射線曝光偵測方法之第二模式之訊號時序示意圖。在一些實施例中，請參閱第3圖及第5B圖，第5B圖之訊號時序圖對應於第3圖中第二階段I2。須說明的是，於第二模式下，第1圖之X射線曝光偵測系統100之平板感測器110之處理器112將依序讀取記憶體111中所儲存之影像Frame N至影像Frame N+4。處理器112將依序比對時序相鄰的兩個影像之相同的感興趣區域之灰階值是否超過預設閾值H(例如：比對影像Frame N及影像Frame N+1, 比對影像Frame N+1及影像Frame N+2)。若影像之感興趣區域之灰階值均超過預設閾值H，處理器112將影像Frame N至影像Frame N+4傳輸至外部系統900。FIG. 5B is a schematic diagram of signal timing in the second mode of the X-ray exposure detection method according to some embodiments of the present invention. In some embodiments, please refer to FIG. 3 and FIG. 5B , the signal timing diagram in FIG. 5B corresponds to the second stage I2 in FIG. 3 . It should be noted that in the second mode, the processor 112 of the flat panel sensor 110 of the X-ray exposure detection system 100 in FIG. 1 will sequentially read the image Frame N to the image Frame stored in the memory 111 N+4. The processor 112 will sequentially compare whether the grayscale value of the same region of interest of two temporally adjacent images exceeds the preset threshold H (for example: compare image Frame N and image Frame N+1, compare image Frame N+1 and Image Frame N+2). If the gray scale values of the ROI of the image exceed the preset threshold H, the processor 112 transmits the image Frame N to the image Frame N+4 to the external system 900 .

依據前述實施例，本案提供一種X射線曝光偵測方法200及X射線曝光偵測系統100，藉以透過比對影像之間的感興趣區域之灰階值是否超過預設閾值來判定X射線曝光偵測系統100之感測陣列113是否照射X射線，藉此無須額外設置硬體設備於X射線曝光偵測系統100中，並藉此清除第一模式下(例如:待機狀況)之感測陣列113內的累積電荷，以避免第二模式下(例如:感測及傳輸X射線之影像)發生影像殘影的情況。According to the above-mentioned embodiments, this application provides an X-ray exposure detection method 200 and an X-ray exposure detection system 100, so as to determine whether the grayscale value of the region of interest between images exceeds a preset threshold to determine the X-ray exposure detection Whether the sensing array 113 of the detection system 100 is irradiating X-rays, thereby eliminating the need for additional hardware devices in the X-ray exposure detection system 100, and thereby clearing the sensing array 113 in the first mode (for example: standby state) In order to avoid image sticking in the second mode (such as: sensing and transmitting X-ray images), the accumulated charge in the second mode can be avoided.

雖然本案以詳細之實施例揭露如上，然而本案並不排除其他可行之實施態樣。因此，本案之保護範圍當視後附之申請專利範圍所界定者為準，而非受於前述實施例之限制。Although this case discloses the above with detailed embodiments, this case does not exclude other feasible implementation modes. Therefore, the scope of protection of this case should be defined by the scope of the appended patent application, rather than being limited by the foregoing embodiments.

對本領域技術人員而言，在不脫離本案之精神和範圍內，當可對本案作各種之更動與潤飾。基於前述實施例，所有對本案所作的更動與潤飾，亦涵蓋於本案之保護範圍內。For those skilled in the art, without departing from the spirit and scope of this document, various changes and modifications can be made to this document. Based on the foregoing embodiments, all changes and modifications made to this case are also covered within the scope of protection of this case.

100:X射線曝光偵測系統 100: X-ray exposure detection system

110:平板感測器 110: Flat panel sensor

111:記憶體 111: Memory

112:處理器 112: Processor

113:感測陣列 113: Sensing array

120:X射線產生器 120:X-ray generator

900:外部系統 900: External system

O:目標物 O: object

200:方法 200: method

210~250:步驟 210~250: steps

I1~I3:階段 I1~I3: stage

I21~I22:子階段 I21~I22: sub-stage

XRAY:X射線訊號 XRAY: X-ray signal

Readout:讀取訊號 Readout: read signal

Reset:重置訊號 Reset: reset signal

ROI:比對結果訊號 ROI: comparison result signal

Transfer:控制訊號 Transfer: control signal

Frame M~Frame M+4:影像 Frame M~Frame M+4: Video

Frame N~Frame N+4:影像 Frame N~Frame N+4: Video

P1~P8:時間點 P1~P8: time point

H:預設閥值 H: preset threshold

參照後續段落中的實施方式以及下列圖式，當可更佳地理解本案的內容： 第1圖為根據本案一些實施例繪示的X射線曝光偵測系統之電路方塊示意圖； 第2圖為根據本案一些實施例繪示的X射線曝光偵測方法之步驟流程示意圖； 第3圖為根據本案一些實施例繪示的X射線曝光偵測方法之實際運作流程之訊號波形示意圖； 第4A圖至第4F圖為根據本案一些實施例繪示的X射線曝光偵測方法之感興趣區域示意圖； 第5A圖為根據本案一些實施例繪示的X射線曝光偵測方法之第一模式之資料狀態示意圖；以及 第5B圖為根據本案一些實施例繪示的X射線曝光偵測方法之第二模式之資料狀態示意圖。 The content of this case can be better understood with reference to the implementation manner in the following paragraphs and the following drawings: Figure 1 is a schematic circuit block diagram of an X-ray exposure detection system according to some embodiments of the present invention; Figure 2 is a schematic flow chart of the steps of the X-ray exposure detection method according to some embodiments of the present invention; Fig. 3 is a schematic diagram of the signal waveform of the actual operation process of the X-ray exposure detection method according to some embodiments of the present invention; Figures 4A to 4F are schematic diagrams of the region of interest of the X-ray exposure detection method according to some embodiments of the present invention; FIG. 5A is a schematic diagram of the data state of the first mode of the X-ray exposure detection method according to some embodiments of the present invention; and FIG. 5B is a schematic diagram of the data state of the second mode of the X-ray exposure detection method according to some embodiments of the present invention.

國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無 Domestic deposit information (please note in order of depositor, date, and number) none Overseas storage information (please note in order of storage country, institution, date, and number) none

200:方法 200: method

210~250:步驟 210~250: steps